Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery

A. Lucieer; M.J. Kraak

Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery

A. Lucieer
, M.J. Kraak

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the conference on visualization and data analysis 2004, EI10
Subtitle of host publication	part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California
Editors	Robert F. Erbacher, Philip C. Chen, Jonathan C. Roberts, Matti T. Gröhn, Katy Börner
Place of Publication	San Jose, USA
Publisher	SPIE
Pages	201-211
Number of pages	6
Publication status	Published - 2004
Event	Conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004 - San Jose, United States Duration: 18 Jan 2004 → 22 Jan 2004

Conference

Conference	Conference on visualization and data analysis 2004, EI10
Country/Territory	United States
City	San Jose
Period	18/01/04 → 22/01/04

Keywords

ADLIB-ART-1149
GIP

Cite this

Lucieer, A., & Kraak, M. J. (2004). Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. In R. F. Erbacher, P. C. Chen, J. C. Roberts, M. T. Gröhn, & K. Börner (Eds.), Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California (pp. 201-211). SPIE.

Lucieer, A. ; Kraak, M.J. / Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California. editor / Robert F. Erbacher ; Philip C. Chen ; Jonathan C. Roberts ; Matti T. Gröhn ; Katy Börner. San Jose, USA : SPIE, 2004. pp. 201-211

@inproceedings{449988e86ba2474a89413f4dfae90318,

title = "Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery",

keywords = "ADLIB-ART-1149, GIP",

author = "A. Lucieer and M.J. Kraak",

year = "2004",

language = "English",

pages = "201--211",

editor = "Erbacher, \{Robert F.\} and Chen, \{Philip C.\} and Roberts, \{Jonathan C.\} and Gr{\"o}hn, \{Matti T.\} and Katy B{\"o}rner",

booktitle = "Proceedings of the conference on visualization and data analysis 2004, EI10",

publisher = "SPIE",

address = "United States",

note = "Conference on visualization and data analysis 2004, EI10 : part of IS\&T SPIE international sympoium on Electronic Imaging 2004 ; Conference date: 18-01-2004 Through 22-01-2004",

}

Lucieer, A & Kraak, MJ 2004, Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. in RF Erbacher, PC Chen, JC Roberts, MT Gröhn & K Börner (eds), Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California. SPIE, San Jose, USA, pp. 201-211, Conference on visualization and data analysis 2004, EI10, San Jose, California, United States, 18/01/04.

Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. / Lucieer, A.; Kraak, M.J.
Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California. ed. / Robert F. Erbacher; Philip C. Chen; Jonathan C. Roberts; Matti T. Gröhn; Katy Börner. San Jose, USA: SPIE, 2004. p. 201-211.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery

AU - Lucieer, A.

AU - Kraak, M.J.

PY - 2004

Y1 - 2004

KW - ADLIB-ART-1149

KW - GIP

UR - https://ezproxy2.utwente.nl/login?url=https://webapps.itc.utwente.nl/library/2004/peer_conf/lucieer.pdf

M3 - Conference contribution

SP - 201

EP - 211

BT - Proceedings of the conference on visualization and data analysis 2004, EI10

A2 - Erbacher, Robert F.

A2 - Chen, Philip C.

A2 - Roberts, Jonathan C.

A2 - Gröhn, Matti T.

A2 - Börner, Katy

PB - SPIE

CY - San Jose, USA

T2 - Conference on visualization and data analysis 2004, EI10

Y2 - 18 January 2004 through 22 January 2004

ER -

Lucieer A, Kraak MJ. Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. In Erbacher RF, Chen PC, Roberts JC, Gröhn MT, Börner K, editors, Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California. San Jose, USA: SPIE. 2004. p. 201-211

Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery

Conference

Keywords

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Cite this