Abstract
Vertical all implanted PNP transistors have been fabricated using high energy ion-implantation. The PNP transistor process can be implemented in standard NPN buried collector processes, with epitaxial layers larger than 2.5 μm, to achieve a high performance complementary bipolar process. The collector is formed by implantation of doubly charged boron ions with an energy of 500 keV. Base and emitter regions are also implanted. Independent change of the base concentration is possible. The base and collector currents are ideal over 5 decades. The current gain is ≅ 35 and constant over 4 decades. Cut off frequencies of the PNP transistors of over 1 GHz have been measured.
Original language | English |
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Title of host publication | ESSDERC '89 |
Subtitle of host publication | Proceedings of the 19th European Solid State Device Research Conference |
Editors | Heiner Ryssel, Anton Heuberger, Peter Lange |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Pages | 519-522 |
Number of pages | 4 |
ISBN (Print) | 978-0-387-51000-2 |
DOIs | |
Publication status | Published - 1989 |
Event | 19th European Solid State Device Research Conference, ESSDERC 1989 - Berlin, Germany Duration: 11 Sept 1989 → 14 Sept 1989 Conference number: 19 |
Publication series
Name | European Solid-State Device Research Conference (ESSDERC) |
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Publisher | IEEE |
Volume | 1989 |
ISSN (Print) | 1930-8876 |
Conference
Conference | 19th European Solid State Device Research Conference, ESSDERC 1989 |
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Abbreviated title | ESSDERC |
Country/Territory | Germany |
City | Berlin |
Period | 11/09/89 → 14/09/89 |