An AFM-based device for in-situ characterization of nano-wear

S. Deladi, N.R. Tas, J.W. Berenschot, M.J. de Boer, G.J.M. Krijnen, M.C. Elwenspoek

    Research output: Contribution to conferencePosterOther research output

    Original languageEnglish
    Publication statusPublished - 13 May 2004
    EventVeeco Instruments Scanning Probe Microscopy applications Conference and Users Meeting 2004 - Eindhoven, Netherlands
    Duration: 13 May 200414 May 2004

    Conference

    ConferenceVeeco Instruments Scanning Probe Microscopy applications Conference and Users Meeting 2004
    CountryNetherlands
    CityEindhoven
    Period13/05/0414/05/04

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