Vector vibrating sample magnetometers (VSMs) can present problems with respect to angular dependent calibration and positional dependency when they are used for measurements on thin film samples, which have dimensions comparable to or larger than the sample–coil distances. The problems are due to the fact that in conventional VSMs the sample is rotating with respect to the coils, when performing angular dependent measurements. In this article a solution is presented based on a setup of VSM detection coils, whose position is linked to that of the sample. Together with a newly designed sample holder, the above mentioned problems are prevented or reduced. The vector detection coil system shows a relatively small error in the determination of the magnetization vector (±1% in the absolute value and ±0.6° in the angle). Furthermore, it has a relatively small positional dependency (1% per mm) combined with a sufficient sensitivity (1 nA m2 or 1 μemu at 10 s time constant) and a capability of using samples up to 10×10 mm2. The improved sample holder for thin film measurements reduces positional problems while, at the same time, reducing the background signals of the holder (to 10 pA m2 per kA/m or 7.958×10−10 emu/Oe).
- SMI-EXP: EXPERIMENTAL TECHNIQUES
- SMI-TST: From 2006 in EWI-TST
- TSTNE-Magnet-VSM: Vibrating Sample Magnetometer