An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations

J. Wan; Hans G. Kerkhoff

doi:10.1109/ISQED.2013.6523587

An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations

J. Wan, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

193 Downloads (Pure)

Abstract

A compact NBTI model is presented by directly solving the reaction-diffusion (RD) equations in a simple way. The new model can handle arbitrary stress conditions without solving time-consuming equations and is hence very suitable for analog/mixed-signal NBTI simulations in SPICE-like environments. The model has been implemented in Cadence ADE with Verilog-A and also takes the stochastic effect of aging into account. The simulation speed has increased at least thousands times. The performance of the model is validated by both RD theoretical solutions as well as silicon results.

Original language	Undefined
Title of host publication	14th International Symposium on Quality Electronic Design (ISQED 2013)
Place of Publication	Santa Clara, CA
Publisher	International Society for Quality Electronic Design
Pages	31-37
Number of pages	7
ISBN (Print)	978-1-4673-4953-6
DOIs	https://doi.org/10.1109/ISQED.2013.6523587
Publication status	Published - 6 Mar 2013
Event	14th International Symposium on Quality Electronic Design, ISQED 2013 - Santa Clara, United States Duration: 4 Mar 2013 → 6 Mar 2013 Conference number: 14

Publication series

Name
Publisher	International Society for Quality Electronic Design
ISSN (Print)	1948-3295

Conference

Conference	14th International Symposium on Quality Electronic Design, ISQED 2013
Abbreviated title	ISQED
Country/Territory	United States
City	Santa Clara
Period	4/03/13 → 6/03/13

Keywords

analog
Reliability
Reaction-Diffusion solution
RD model
NBTI
mixed-signal
EWI-22697
METIS-299959
IR-87463
Simulation

Access to Document

10.1109/ISQED.2013.6523587

ISQED2013_paper_132_final_submission_final_version

Cite this

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title = "An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations",

abstract = "A compact NBTI model is presented by directly solving the reaction-diffusion (RD) equations in a simple way. The new model can handle arbitrary stress conditions without solving time-consuming equations and is hence very suitable for analog/mixed-signal NBTI simulations in SPICE-like environments. The model has been implemented in Cadence ADE with Verilog-A and also takes the stochastic effect of aging into account. The simulation speed has increased at least thousands times. The performance of the model is validated by both RD theoretical solutions as well as silicon results.",

keywords = "analog, Reliability, Reaction-Diffusion solution, RD model, NBTI, mixed-signal, EWI-22697, METIS-299959, IR-87463, Simulation",

author = "J. Wan and Kerkhoff, {Hans G.}",

note = "10.1109/ISQED.2013.6523587 ; 14th International Symposium on Quality Electronic Design, ISQED 2013 ; Conference date: 04-03-2013 Through 06-03-2013",

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doi = "10.1109/ISQED.2013.6523587",

language = "Undefined",

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Wan, J & Kerkhoff, HG 2013, An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. in 14th International Symposium on Quality Electronic Design (ISQED 2013). International Society for Quality Electronic Design, Santa Clara, CA, pp. 31-37, 14th International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, California, United States, 4/03/13. https://doi.org/10.1109/ISQED.2013.6523587

An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. / Wan, J.; Kerkhoff, Hans G.
14th International Symposium on Quality Electronic Design (ISQED 2013). Santa Clara, CA: International Society for Quality Electronic Design, 2013. p. 31-37.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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