An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations

J. Wan, Hans G. Kerkhoff

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    1 Citation (Scopus)
    106 Downloads (Pure)

    Abstract

    A compact NBTI model is presented by directly solving the reaction-diffusion (RD) equations in a simple way. The new model can handle arbitrary stress conditions without solving time-consuming equations and is hence very suitable for analog/mixed-signal NBTI simulations in SPICE-like environments. The model has been implemented in Cadence ADE with Verilog-A and also takes the stochastic effect of aging into account. The simulation speed has increased at least thousands times. The performance of the model is validated by both RD theoretical solutions as well as silicon results.
    Original languageUndefined
    Title of host publication14th International Symposium on Quality Electronic Design (ISQED 2013)
    Place of PublicationSanta Clara, CA
    PublisherInternational Society for Quality Electronic Design
    Pages31-37
    Number of pages7
    ISBN (Print)978-1-4673-4953-6
    DOIs
    Publication statusPublished - 6 Mar 2013
    Event14th International Symposium on Quality Electronic Design, ISQED 2013 - Santa Clara, United States
    Duration: 4 Mar 20136 Mar 2013
    Conference number: 14

    Publication series

    Name
    PublisherInternational Society for Quality Electronic Design
    ISSN (Print)1948-3295

    Conference

    Conference14th International Symposium on Quality Electronic Design, ISQED 2013
    Abbreviated titleISQED
    CountryUnited States
    CitySanta Clara
    Period4/03/136/03/13

    Keywords

    • analog
    • Reliability
    • Reaction-Diffusion solution
    • RD model
    • NBTI
    • mixed-signal
    • EWI-22697
    • METIS-299959
    • IR-87463
    • Simulation

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