An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability

Hans G. Kerkhoff, Ghazanfar Ali, Hassan Ebrahimi, Ahmed Mohammed Youssef Ibrahim

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    3 Citations (Scopus)
    1 Downloads (Pure)

    Abstract

    In safety-critical systems, many-processor Systems-on-Chip are being increasingly employed. An example is an imminent collision detection System-on-Chip for cars. Such a system requires zero downtime and a very high reliability despite aging issues under harsh environmental conditions. By monitoring the health status of processor cores and other IPs, and taking appropriate counteractions if required, we accomplished this goal via IJTAG compatible embedded instruments. This paper shows the design of the required IJTAG network, and a number of new IJTAG-compatible embedded instruments like slack-delay, power-supply current IDDT and Intermittent Resistive Fault monitors. In addition, we discuss their numbers and optimal locations in a processor core and provide a PDL description for one of our embedded instruments. In the case of for instance a four-processor implementation, requiring only two for actual data processing, the lifetime can increase by a factor of roughly three.
    Original languageEnglish
    Title of host publication2017 International Test Conference in Asia (ITC-Asia)
    Pages65-70
    Number of pages6
    ISBN (Electronic)978-1-5386-3051-8
    DOIs
    Publication statusPublished - 13 Sep 2017
    EventInternational Test Conference in Asia 2017 - TWTC Nangang Exhibition Hall, Taipei City, Taiwan, Province of China
    Duration: 13 Sep 201715 Sep 2017
    http://windy.ee.nthu.edu.tw/ITC-Asia-2017/HOME.html

    Conference

    ConferenceInternational Test Conference in Asia 2017
    Abbreviated titleITC-Asia 2017
    CountryTaiwan, Province of China
    CityTaipei City
    Period13/09/1715/09/17
    Internet address

    Keywords

    • automotive electronics
    • embedded systems
    • integrated circuit reliability
    • integrated circuit testing
    • system-on-chip
    • IJTAG-compatible embedded instruments
    • PDL description
    • advanced embedded instrument infrastructure
    • aging
    • NFF
    • Intermittent Resistive Faults
    • monitor
    • IEEE 1687 Standard
    • Temperature sensors
    • power-supply current IDDT

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