An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability

Hans G. Kerkhoff; Ghazanfar  Ali; Hassan  Ebrahimi; Ahmed Mohammed Youssef Ibrahim

doi:10.1109/ITC-ASIA.2017.8097113

An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability

Hans G. Kerkhoff, Ghazanfar Ali, Hassan Ebrahimi, Ahmed Mohammed Youssef Ibrahim

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

3 Downloads (Pure)

Abstract

In safety-critical systems, many-processor Systems-on-Chip are being increasingly employed. An example is an imminent collision detection System-on-Chip for cars. Such a system requires zero downtime and a very high reliability despite aging issues under harsh environmental conditions. By monitoring the health status of processor cores and other IPs, and taking appropriate counteractions if required, we accomplished this goal via IJTAG compatible embedded instruments. This paper shows the design of the required IJTAG network, and a number of new IJTAG-compatible embedded instruments like slack-delay, power-supply current IDDT and Intermittent Resistive Fault monitors. In addition, we discuss their numbers and optimal locations in a processor core and provide a PDL description for one of our embedded instruments. In the case of for instance a four-processor implementation, requiring only two for actual data processing, the lifetime can increase by a factor of roughly three.

Original language	English
Title of host publication	2017 International Test Conference in Asia (ITC-Asia)
Pages	65-70
Number of pages	6
ISBN (Electronic)	978-1-5386-3051-8
DOIs	https://doi.org/10.1109/ITC-ASIA.2017.8097113
Publication status	Published - 13 Sept 2017
Event	2017 IEEE International Test Conference in Asia, ITC-Asia 2017 - TWTC Nangang Exhibition Hall, Taipei City, Taiwan Duration: 13 Sept 2017 → 15 Sept 2017 http://windy.ee.nthu.edu.tw/ITC-Asia-2017/HOME.html

Conference

Conference	2017 IEEE International Test Conference in Asia, ITC-Asia 2017
Abbreviated title	ITC-Asia
Country/Territory	Taiwan
City	Taipei City
Period	13/09/17 → 15/09/17
Internet address	http://windy.ee.nthu.edu.tw/ITC-Asia-2017/HOME.html

Keywords

automotive electronics
embedded systems
integrated circuit reliability
integrated circuit testing
system-on-chip
IJTAG-compatible embedded instruments
PDL description
advanced embedded instrument infrastructure
aging
NFF
Intermittent Resistive Faults
monitor
IEEE 1687 Standard
Temperature sensors
power-supply current IDDT

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10.1109/ITC-ASIA.2017.8097113

Cite this

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title = "An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability",

abstract = "In safety-critical systems, many-processor Systems-on-Chip are being increasingly employed. An example is an imminent collision detection System-on-Chip for cars. Such a system requires zero downtime and a very high reliability despite aging issues under harsh environmental conditions. By monitoring the health status of processor cores and other IPs, and taking appropriate counteractions if required, we accomplished this goal via IJTAG compatible embedded instruments. This paper shows the design of the required IJTAG network, and a number of new IJTAG-compatible embedded instruments like slack-delay, power-supply current IDDT and Intermittent Resistive Fault monitors. In addition, we discuss their numbers and optimal locations in a processor core and provide a PDL description for one of our embedded instruments. In the case of for instance a four-processor implementation, requiring only two for actual data processing, the lifetime can increase by a factor of roughly three.",

keywords = "automotive electronics, embedded systems, integrated circuit reliability, integrated circuit testing, system-on-chip, IJTAG-compatible embedded instruments, PDL description, advanced embedded instrument infrastructure, aging, NFF, Intermittent Resistive Faults, monitor, IEEE 1687 Standard, Temperature sensors, power-supply current IDDT",

author = "Kerkhoff, {Hans G.} and Ghazanfar Ali and Hassan Ebrahimi and Ibrahim, {Ahmed Mohammed Youssef}",

year = "2017",

month = sep,

day = "13",

doi = "10.1109/ITC-ASIA.2017.8097113",

language = "English",

pages = "65--70",

booktitle = "2017 International Test Conference in Asia (ITC-Asia)",

note = "2017 IEEE International Test Conference in Asia, ITC-Asia 2017, ITC-Asia ; Conference date: 13-09-2017 Through 15-09-2017",

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AU - Kerkhoff, Hans G.

AU - Ali, Ghazanfar

AU - Ebrahimi, Hassan

AU - Ibrahim, Ahmed Mohammed Youssef

PY - 2017/9/13

Y1 - 2017/9/13

N2 - In safety-critical systems, many-processor Systems-on-Chip are being increasingly employed. An example is an imminent collision detection System-on-Chip for cars. Such a system requires zero downtime and a very high reliability despite aging issues under harsh environmental conditions. By monitoring the health status of processor cores and other IPs, and taking appropriate counteractions if required, we accomplished this goal via IJTAG compatible embedded instruments. This paper shows the design of the required IJTAG network, and a number of new IJTAG-compatible embedded instruments like slack-delay, power-supply current IDDT and Intermittent Resistive Fault monitors. In addition, we discuss their numbers and optimal locations in a processor core and provide a PDL description for one of our embedded instruments. In the case of for instance a four-processor implementation, requiring only two for actual data processing, the lifetime can increase by a factor of roughly three.

AB - In safety-critical systems, many-processor Systems-on-Chip are being increasingly employed. An example is an imminent collision detection System-on-Chip for cars. Such a system requires zero downtime and a very high reliability despite aging issues under harsh environmental conditions. By monitoring the health status of processor cores and other IPs, and taking appropriate counteractions if required, we accomplished this goal via IJTAG compatible embedded instruments. This paper shows the design of the required IJTAG network, and a number of new IJTAG-compatible embedded instruments like slack-delay, power-supply current IDDT and Intermittent Resistive Fault monitors. In addition, we discuss their numbers and optimal locations in a processor core and provide a PDL description for one of our embedded instruments. In the case of for instance a four-processor implementation, requiring only two for actual data processing, the lifetime can increase by a factor of roughly three.

KW - automotive electronics

KW - embedded systems

KW - integrated circuit reliability

KW - integrated circuit testing

KW - system-on-chip

KW - IJTAG-compatible embedded instruments

KW - PDL description

KW - advanced embedded instrument infrastructure

KW - aging

KW - NFF

KW - Intermittent Resistive Faults

KW - monitor

KW - IEEE 1687 Standard

KW - Temperature sensors

KW - power-supply current IDDT

U2 - 10.1109/ITC-ASIA.2017.8097113

DO - 10.1109/ITC-ASIA.2017.8097113

M3 - Conference contribution

SP - 65

EP - 70

BT - 2017 International Test Conference in Asia (ITC-Asia)

T2 - 2017 IEEE International Test Conference in Asia, ITC-Asia 2017

Y2 - 13 September 2017 through 15 September 2017

ER -

An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability

Abstract

Conference

Keywords

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Cite this