An embedded health-monitoring infrastructure for a reliable multi-core processor

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Abstract

    An embedded health-monitoring infrastructure for highly reliable SoCs for datastreaming systems is presented. Different from the traditional testing approach for a dependable design, our infrastructure is based on prognostics from health-monitoring sensors that are embedded in the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. The health-monitoring scheme and the sensor structure are presented.
    Original languageUndefined
    Title of host publicationProceedings of the Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, Median 2013
    EditorsYong Zhao
    PublisherCOST
    Pages31-34
    Number of pages4
    ISBN (Print)978-2-11129175-1
    Publication statusPublished - 30 May 2013

    Publication series

    Name
    PublisherCOST

    Keywords

    • EWI-24291
    • nano electronics
    • dependability testing
    • prognostics
    • IR-88881
    • repair
    • MP-SoC
    • Health Monitoring
    • METIS-302634
    • reliability sensor

    Cite this

    Kerkhoff, H. G. (2013). An embedded health-monitoring infrastructure for a reliable multi-core processor. In Y. Zhao (Ed.), Proceedings of the Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, Median 2013 (pp. 31-34). COST.
    Kerkhoff, Hans G. / An embedded health-monitoring infrastructure for a reliable multi-core processor. Proceedings of the Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, Median 2013. editor / Yong Zhao. COST, 2013. pp. 31-34
    @inproceedings{4393e22e468241328204b52f4d10ecfb,
    title = "An embedded health-monitoring infrastructure for a reliable multi-core processor",
    abstract = "An embedded health-monitoring infrastructure for highly reliable SoCs for datastreaming systems is presented. Different from the traditional testing approach for a dependable design, our infrastructure is based on prognostics from health-monitoring sensors that are embedded in the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. The health-monitoring scheme and the sensor structure are presented.",
    keywords = "EWI-24291, nano electronics, dependability testing, prognostics, IR-88881, repair, MP-SoC, Health Monitoring, METIS-302634, reliability sensor",
    author = "Kerkhoff, {Hans G.}",
    note = "http://www.median-project.eu/",
    year = "2013",
    month = "5",
    day = "30",
    language = "Undefined",
    isbn = "978-2-11129175-1",
    publisher = "COST",
    pages = "31--34",
    editor = "Yong Zhao",
    booktitle = "Proceedings of the Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, Median 2013",

    }

    Kerkhoff, HG 2013, An embedded health-monitoring infrastructure for a reliable multi-core processor. in Y Zhao (ed.), Proceedings of the Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, Median 2013. COST, pp. 31-34.

    An embedded health-monitoring infrastructure for a reliable multi-core processor. / Kerkhoff, Hans G.

    Proceedings of the Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, Median 2013. ed. / Yong Zhao. COST, 2013. p. 31-34.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    AB - An embedded health-monitoring infrastructure for highly reliable SoCs for datastreaming systems is presented. Different from the traditional testing approach for a dependable design, our infrastructure is based on prognostics from health-monitoring sensors that are embedded in the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. The health-monitoring scheme and the sensor structure are presented.

    KW - EWI-24291

    KW - nano electronics

    KW - dependability testing

    KW - prognostics

    KW - IR-88881

    KW - repair

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    KW - METIS-302634

    KW - reliability sensor

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    Kerkhoff HG. An embedded health-monitoring infrastructure for a reliable multi-core processor. In Zhao Y, editor, Proceedings of the Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, Median 2013. COST. 2013. p. 31-34