An embedded offset and gain instrument for OpAmp IPs

J. Wan, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    3 Citations (Scopus)
    4 Downloads (Pure)


    Analog and mixed-signal IPs are increasingly required to use digital fabrication technologies and are deeply embedded into system-on-chips (SoC). These developments append more requirements and challenges on analog testing methodologies. Traditional analog testing methods suffer from less accessibility and control with regard to these embedded analog circuits in SoCs. As an alternative, an embedded instrument for analog OpAmp IP tests is proposed in this paper. It can provide the exact gain and offset values of OpAmps instead of only pass/fail result. What's more, it is an non-invasive monitor and can work online without isolating the DUT Opamp from its surrounding feedback networks. Nor does it require accurate test stimulations. In addition, the monitor can remove its own offsets without additional complex self-calibration circuits. All self-calibrations are completed in the digital domain after each measurement in real time. Therefore it is also suitable for aging-sensitive applications, in which the monitor may suffer from aging mechanisms and has additional offset drifts as well. The monitor measurement range for offset is from 0.2mV to 70mV, and for gain it is from 0dB to 40dB. The error for offset measurements can be 10% of the measurement value with plus/minus 0.1mV, and -2.5dB for gain measurements.
    Original languageUndefined
    Title of host publicationDesign, Automation and Test in Europe Conference and Exhibition, DATE 2014
    Place of PublicationDresden
    PublisherElectronic Design Automation Publishing Association
    Number of pages4
    ISBN (Print)978-3-9815370-2-4
    Publication statusPublished - 28 Mar 2014
    Event2014 Design, Automation and Test in Europe Conference & Exhibition, DATE 2014 - Dresden, Germany
    Duration: 24 Mar 201428 Mar 2014

    Publication series

    PublisherElectronic Design Automation Publishing Association


    Conference2014 Design, Automation and Test in Europe Conference & Exhibition, DATE 2014
    Abbreviated titleDATE


    • CAES-TDT: Testable Design and Test
    • offset monitor
    • gain monitor
    • IR-93273
    • EWI-25307
    • NBTI
    • METIS-309663
    • Opamp

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