An evanescent-field optical microscope

N.F. van Hulst, N.P. de Boer, B. Bölger

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Abstract

The classic diffraction limit of resolution in optical microscopy (∼γ/2) can be overcome by detecting the diffracted field of a submicrometre‐size probe in its near field. The present stage of this so‐called scanning near‐field optical microscopy (SNOM) is reviewed.

An evanescent‐field optical microscope (EFOM) is presented in which the near‐field regime is provided by the exponentially decaying evanescent field caused by total internal reflection at a refractive‐index transition. A sample placed in this field causes a spatial variation of the evanescent field which is characteristic for the dielectric and topographic properties of the sample. The evanescent field is frustrated by a dielectric probe and thus converted into a radiative field.

In our case the probe consists either of an etched optical fibre or of a highly sharpened diamond tip. The probe is scanned over the sample surface with nanometre precision using a piezo‐electric positioner. The distance between probe and sample is controlled by a feedback on the detected optical signal. The resolution of the microscope is determined by both the gradient of the evanescent field and the sharpness of the tip. Details of the experimental set‐up are discussed.

The coupling of the evanescent field to the submicrometre probe as a function of probe‐sample distance, angle of incidence and polarization has been characterized quantitatively. The observed coupling is generally in agreement with presented theoretical calculations.

Microscopy has been performed on a regular latex sphere structure, which clearly demonstrates the capacity of the evanescent‐field optical microscope for nanometre‐scale optical imaging. Resolution is typically 100 nm laterally and 10 nm vertically.

The technique is promising for biological applications, especially if combined with optical spectroscopy.
Original languageEnglish
Pages (from-to)117-130
Number of pages14
JournalJournal of microscopy
Volume163
Issue number2
DOIs
Publication statusPublished - 1991

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Microscopy
Optical Fibers
Diamond
Optical Imaging
Microspheres
Spectrum Analysis
Incidence

Cite this

van Hulst, N. F., de Boer, N. P., & Bölger, B. (1991). An evanescent-field optical microscope. Journal of microscopy, 163(2), 117-130. https://doi.org/10.1111/j.1365-2818.1991.tb03166.x
van Hulst, N.F. ; de Boer, N.P. ; Bölger, B. / An evanescent-field optical microscope. In: Journal of microscopy. 1991 ; Vol. 163, No. 2. pp. 117-130.
@article{9e9c1b7174204029abc7ba4fa18587dc,
title = "An evanescent-field optical microscope",
abstract = "The classic diffraction limit of resolution in optical microscopy (∼γ/2) can be overcome by detecting the diffracted field of a submicrometre‐size probe in its near field. The present stage of this so‐called scanning near‐field optical microscopy (SNOM) is reviewed.An evanescent‐field optical microscope (EFOM) is presented in which the near‐field regime is provided by the exponentially decaying evanescent field caused by total internal reflection at a refractive‐index transition. A sample placed in this field causes a spatial variation of the evanescent field which is characteristic for the dielectric and topographic properties of the sample. The evanescent field is frustrated by a dielectric probe and thus converted into a radiative field.In our case the probe consists either of an etched optical fibre or of a highly sharpened diamond tip. The probe is scanned over the sample surface with nanometre precision using a piezo‐electric positioner. The distance between probe and sample is controlled by a feedback on the detected optical signal. The resolution of the microscope is determined by both the gradient of the evanescent field and the sharpness of the tip. Details of the experimental set‐up are discussed.The coupling of the evanescent field to the submicrometre probe as a function of probe‐sample distance, angle of incidence and polarization has been characterized quantitatively. The observed coupling is generally in agreement with presented theoretical calculations.Microscopy has been performed on a regular latex sphere structure, which clearly demonstrates the capacity of the evanescent‐field optical microscope for nanometre‐scale optical imaging. Resolution is typically 100 nm laterally and 10 nm vertically.The technique is promising for biological applications, especially if combined with optical spectroscopy.",
author = "{van Hulst}, N.F. and {de Boer}, N.P. and B. B{\"o}lger",
year = "1991",
doi = "10.1111/j.1365-2818.1991.tb03166.x",
language = "English",
volume = "163",
pages = "117--130",
journal = "Journal of microscopy",
issn = "0022-2720",
publisher = "Wiley-Blackwell",
number = "2",

}

van Hulst, NF, de Boer, NP & Bölger, B 1991, 'An evanescent-field optical microscope', Journal of microscopy, vol. 163, no. 2, pp. 117-130. https://doi.org/10.1111/j.1365-2818.1991.tb03166.x

An evanescent-field optical microscope. / van Hulst, N.F.; de Boer, N.P.; Bölger, B.

In: Journal of microscopy, Vol. 163, No. 2, 1991, p. 117-130.

Research output: Contribution to journalReview articleAcademicpeer-review

TY - JOUR

T1 - An evanescent-field optical microscope

AU - van Hulst, N.F.

AU - de Boer, N.P.

AU - Bölger, B.

PY - 1991

Y1 - 1991

N2 - The classic diffraction limit of resolution in optical microscopy (∼γ/2) can be overcome by detecting the diffracted field of a submicrometre‐size probe in its near field. The present stage of this so‐called scanning near‐field optical microscopy (SNOM) is reviewed.An evanescent‐field optical microscope (EFOM) is presented in which the near‐field regime is provided by the exponentially decaying evanescent field caused by total internal reflection at a refractive‐index transition. A sample placed in this field causes a spatial variation of the evanescent field which is characteristic for the dielectric and topographic properties of the sample. The evanescent field is frustrated by a dielectric probe and thus converted into a radiative field.In our case the probe consists either of an etched optical fibre or of a highly sharpened diamond tip. The probe is scanned over the sample surface with nanometre precision using a piezo‐electric positioner. The distance between probe and sample is controlled by a feedback on the detected optical signal. The resolution of the microscope is determined by both the gradient of the evanescent field and the sharpness of the tip. Details of the experimental set‐up are discussed.The coupling of the evanescent field to the submicrometre probe as a function of probe‐sample distance, angle of incidence and polarization has been characterized quantitatively. The observed coupling is generally in agreement with presented theoretical calculations.Microscopy has been performed on a regular latex sphere structure, which clearly demonstrates the capacity of the evanescent‐field optical microscope for nanometre‐scale optical imaging. Resolution is typically 100 nm laterally and 10 nm vertically.The technique is promising for biological applications, especially if combined with optical spectroscopy.

AB - The classic diffraction limit of resolution in optical microscopy (∼γ/2) can be overcome by detecting the diffracted field of a submicrometre‐size probe in its near field. The present stage of this so‐called scanning near‐field optical microscopy (SNOM) is reviewed.An evanescent‐field optical microscope (EFOM) is presented in which the near‐field regime is provided by the exponentially decaying evanescent field caused by total internal reflection at a refractive‐index transition. A sample placed in this field causes a spatial variation of the evanescent field which is characteristic for the dielectric and topographic properties of the sample. The evanescent field is frustrated by a dielectric probe and thus converted into a radiative field.In our case the probe consists either of an etched optical fibre or of a highly sharpened diamond tip. The probe is scanned over the sample surface with nanometre precision using a piezo‐electric positioner. The distance between probe and sample is controlled by a feedback on the detected optical signal. The resolution of the microscope is determined by both the gradient of the evanescent field and the sharpness of the tip. Details of the experimental set‐up are discussed.The coupling of the evanescent field to the submicrometre probe as a function of probe‐sample distance, angle of incidence and polarization has been characterized quantitatively. The observed coupling is generally in agreement with presented theoretical calculations.Microscopy has been performed on a regular latex sphere structure, which clearly demonstrates the capacity of the evanescent‐field optical microscope for nanometre‐scale optical imaging. Resolution is typically 100 nm laterally and 10 nm vertically.The technique is promising for biological applications, especially if combined with optical spectroscopy.

U2 - 10.1111/j.1365-2818.1991.tb03166.x

DO - 10.1111/j.1365-2818.1991.tb03166.x

M3 - Review article

VL - 163

SP - 117

EP - 130

JO - Journal of microscopy

JF - Journal of microscopy

SN - 0022-2720

IS - 2

ER -