An Evanescent Field Optical Microscope

N.F. van Hulst, F.B. Segerink, B. Bölger

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

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Abstract

An Evanescent Field Optical Microscope (EFOM) is presented, which employs frustrated total internal reflection on a highly localized scale by means of a sharp dielectric tip. The coupling of the evanescent field to the sub-micrometer probe as a function of probe-sample distance, angle of incidence and polarization has been characterized quantitatively both experimentally and theoretically. The coupling efficiency of light into the tip agrees with a description based on complex Fresnel coefficients. By scanning the tip images have been obtained of non-conducting dielectric samples, periodic gratings and non periodic structures, containing both topographic and dielectric information which clearly demonstrate the capacity of the evanescent field optical microscope for nanometer scale optical imaging. The effect of field gradient, tip-sample distance, polarization direction and tip artifacts on the images has been investigated. Recent results are presented.
Original languageEnglish
Title of host publicationScanned Probe Microscopy
EditorsH. Kumar Wickramasinghe
Place of PublicationNew York, NY
PublisherAIP Publishing LLC
Pages79-94
Number of pages16
ISBN (Print)0-88318-816-3
DOIs
Publication statusPublished - 1991
EventScanned Probe Microscopy 1991 - Santa Barbara, United States
Duration: 6 Jan 199111 Jan 1991

Publication series

NameAIP Conference Proceedings
PublisherAIP
Volume241

Conference

ConferenceScanned Probe Microscopy 1991
CountryUnited States
CitySanta Barbara
Period6/01/9111/01/91

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optical microscopes
probes
polarization
artifacts
micrometers
incidence
gratings
gradients
scanning
coefficients

Cite this

van Hulst, N. F., Segerink, F. B., & Bölger, B. (1991). An Evanescent Field Optical Microscope. In H. K. Wickramasinghe (Ed.), Scanned Probe Microscopy (pp. 79-94). (AIP Conference Proceedings; Vol. 241). New York, NY: AIP Publishing LLC. https://doi.org/10.1063/1.41406
van Hulst, N.F. ; Segerink, F.B. ; Bölger, B. / An Evanescent Field Optical Microscope. Scanned Probe Microscopy. editor / H. Kumar Wickramasinghe. New York, NY : AIP Publishing LLC, 1991. pp. 79-94 (AIP Conference Proceedings).
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van Hulst, NF, Segerink, FB & Bölger, B 1991, An Evanescent Field Optical Microscope. in HK Wickramasinghe (ed.), Scanned Probe Microscopy. AIP Conference Proceedings, vol. 241, AIP Publishing LLC, New York, NY, pp. 79-94, Scanned Probe Microscopy 1991, Santa Barbara, United States, 6/01/91. https://doi.org/10.1063/1.41406

An Evanescent Field Optical Microscope. / van Hulst, N.F.; Segerink, F.B.; Bölger, B.

Scanned Probe Microscopy. ed. / H. Kumar Wickramasinghe. New York, NY : AIP Publishing LLC, 1991. p. 79-94 (AIP Conference Proceedings; Vol. 241).

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

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AB - An Evanescent Field Optical Microscope (EFOM) is presented, which employs frustrated total internal reflection on a highly localized scale by means of a sharp dielectric tip. The coupling of the evanescent field to the sub-micrometer probe as a function of probe-sample distance, angle of incidence and polarization has been characterized quantitatively both experimentally and theoretically. The coupling efficiency of light into the tip agrees with a description based on complex Fresnel coefficients. By scanning the tip images have been obtained of non-conducting dielectric samples, periodic gratings and non periodic structures, containing both topographic and dielectric information which clearly demonstrate the capacity of the evanescent field optical microscope for nanometer scale optical imaging. The effect of field gradient, tip-sample distance, polarization direction and tip artifacts on the images has been investigated. Recent results are presented.

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van Hulst NF, Segerink FB, Bölger B. An Evanescent Field Optical Microscope. In Wickramasinghe HK, editor, Scanned Probe Microscopy. New York, NY: AIP Publishing LLC. 1991. p. 79-94. (AIP Conference Proceedings). https://doi.org/10.1063/1.41406