An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures

V. Zivkovic, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)203-212
    Number of pages10
    JournalJournal of electronic testing
    Volume18
    Issue number2
    Publication statusPublished - 2002

    Keywords

    • METIS-208721

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