An improved method for determining the inversion layer mobility of electrons in trench MOSFETs

M.G.L. van den Heuvel, Raymond Josephus Engelbart Hueting, E.A. Hijzen, M.A.A. in ‘t Zandt

    Research output: Contribution to conferencePaper

    6 Citations (Scopus)
    146 Downloads (Pure)

    Fingerprint

    Dive into the research topics of 'An improved method for determining the inversion layer mobility of electrons in trench MOSFETs'. Together they form a unique fingerprint.

    Earth & Environmental Sciences