An indirect technique for estimating reliability of analog and mixed-signal systems during operational life

M.A. Khan, Hans G. Kerkhoff

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    Abstract

    Reliability of electronic systems has been thoroughly investigated in literature and a number of analytical approaches at the design stage are already available via examination of the circuit-level reliability effects based on device-level models. Reliability estimation during operational life of an electronic system still lacks a solution especially for analog and mixed signal systems. The current work will present a novel technique for indirectly estimating reliability during operational life of an electronic system. Reliability simulations during the design stage of a potential critical performance parameter, sensitive to aging effects, over a range of input-stress voltages and working-stress temperatures have been used to generate a set of degradation values per unit time. These values are then used at the system level to estimate the degradation in that particular performance parameter and hence system reliability by regularly monitoring the input-stress voltages and working-stress temperatures. The simulation results conducted for an example target system in a LabVIEW environment show that the proposed technique is viable.
    Original languageUndefined
    Title of host publication16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013
    Place of PublicationLos Alamitos, CA, USA
    PublisherIEEE
    Pages159-164
    Number of pages6
    ISBN (Print)978-1-4673-6135-4
    DOIs
    Publication statusPublished - 8 Apr 2013
    Event16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013 - Karlovy Vary, Czech Republic
    Duration: 8 Apr 201310 Apr 2013
    Conference number: 16
    http://www.fit.vutbr.cz/events/ddecs2013/about.php?section=about
    http://www.ddecs.org/

    Publication series

    Name
    PublisherIEEE

    Conference

    Conference16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013
    Abbreviated titleDDECS
    CountryCzech Republic
    CityKarlovy Vary
    Period8/04/1310/04/13
    Internet address

    Keywords

    • CAES-TDT: Testable Design and Test
    • offset voltage
    • input signal monitoring
    • temperature monitoring
    • METIS-300089
    • EWI-23840
    • Reliability
    • IR-87491
    • time before failure

    Cite this

    Khan, M. A., & Kerkhoff, H. G. (2013). An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. In 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013 (pp. 159-164). Los Alamitos, CA, USA: IEEE. https://doi.org/10.1109/DDECS.2013.6549809