An Integrated Test and Design Environment for Test Development for Mixed-Signal Circuits

N. Engin, Hans G. Kerkhoff, R.J.W.T. Tangelder, H. Speek

    Research output: Other contribution › Other research output

    Original languageUndefined
    Place of PublicationMierlo The Netherlands
    Publication statusPublished - 27 Nov 1997

    Keywords

    • METIS-114733

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