An Integrated Test and Design Environment for Test Development for Mixed-Signal Circuits

  • N. Engin
  • , Hans G. Kerkhoff
  • , R.J.W.T. Tangelder
  • , H. Speek

    Research output: Other contribution › Other research output

    Original languageUndefined
    Place of PublicationMierlo The Netherlands
    Publication statusPublished - 27 Nov 1997

    Keywords

    • METIS-114733

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