An Interleaving Track & Hold with 7.6 ENOB @ 1.6 GS/s in 0.12 µm CMOS

S.M. Louwsma, Adrianus Johannes Maria van Tuijl, Maarten Vertregt, Peter C.S. Scholtens, Bram Nauta

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

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    Abstract

    A 1.6 GS/s Track and Hold circuit that produces 16 interleaving, 100 MS/s voltage buffered output signals is presented. The achieved SFDR for a 950 MHz full scale input signal is 50 dB. Phase alignment is 0.4 ps RMS and aperture uncertainty is 1 ps RMS. The chip includes two Analog to Digital Converters and a Switching Matrix to accommodate measurement of all sampled output signals and their timing relation. Chip area is 0.14 mm2 excluding the AD Converters. The chip is made in a 0.12 mm, 1.2 V CMOS Process. Power consumption of the interleaving T/H circuit is 32 mW.
    Original languageUndefined
    Title of host publicationthe 15th ProRisc workshop on Circuits, Systems and Signal Processing (ProRisc 2004)
    Place of PublicationUtrecht
    PublisherSTW
    Pages546-550
    Number of pages5
    ISBN (Print)90-73461-43-X
    Publication statusPublished - Nov 2004
    Event15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 - Veldhoven, Netherlands
    Duration: 25 Nov 200426 Nov 2004
    Conference number: 15

    Publication series

    Name
    PublisherSTW Technology Foundation

    Conference

    Conference15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004
    Abbreviated titleProRisc
    CountryNetherlands
    CityVeldhoven
    Period25/11/0426/11/04

    Keywords

    • Jitter
    • interleaving
    • track and hold
    • sample and hold
    • EWI-14497
    • METIS-221474
    • IR-49274
    • AD-converter

    Cite this

    Louwsma, S. M., van Tuijl, A. J. M., Vertregt, M., Scholtens, P. C. S., & Nauta, B. (2004). An Interleaving Track & Hold with 7.6 ENOB @ 1.6 GS/s in 0.12 µm CMOS. In the 15th ProRisc workshop on Circuits, Systems and Signal Processing (ProRisc 2004) (pp. 546-550). Utrecht: STW.