An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips

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Abstract

The IEEE 1687 standard defines a standardized mechanism for the off-chip access of embedded instruments. A subset of these instruments are also used for maintaining the reliability and functional safety of the chip during its lifetime. For example, temperature sensors, voltage monitors and Built-In-Self-Test engines. In this paper, we present a novel on-chip controller for IEEE 1687 networks which can execute instrument procedures documented in the IEEE 1687 PDL language. These procedures are incorporated within the reliability and functional safety embedded software that uses the measurements data of the instruments. The controller includes an efficient structural model of the IEEE 1687 network and can perform on-chip pattern retargeting on arbitrary networks. In addition, it can perform localization of instrument interrupts that are propagated via multi-mode IEEE 1687 networks.
Original languageEnglish
Title of host publication2019 IEEE International Test Conference in Asia (ITC-Asia)
Place of PublicationPiscataway, NJ
PublisherIEEE
Number of pages6
ISBN (Electronic)978-1-7281-4718-5
ISBN (Print)978-1-7281-4719-2
DOIs
Publication statusPublished - 3 Sep 2019
Event2019 IEEE International Test Conference in Asia, ITC-Asia - Tokyo, Japan
Duration: 3 Sep 20195 Sep 2019

Conference

Conference2019 IEEE International Test Conference in Asia, ITC-Asia
Abbreviated titleITC-Asia
CountryJapan
CityTokyo
Period3/09/195/09/19

Fingerprint

Controllers
Embedded software
Built-in self test
Temperature sensors
System-on-chip
Engines
Electric potential

Keywords

  • IEEE 1687
  • IJTAG
  • Embedded instruments
  • Dependability
  • Reliability
  • Functional safety

Cite this

@inproceedings{afebad53e2f8402b93bb5a7e224abf3d,
title = "An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips",
abstract = "The IEEE 1687 standard defines a standardized mechanism for the off-chip access of embedded instruments. A subset of these instruments are also used for maintaining the reliability and functional safety of the chip during its lifetime. For example, temperature sensors, voltage monitors and Built-In-Self-Test engines. In this paper, we present a novel on-chip controller for IEEE 1687 networks which can execute instrument procedures documented in the IEEE 1687 PDL language. These procedures are incorporated within the reliability and functional safety embedded software that uses the measurements data of the instruments. The controller includes an efficient structural model of the IEEE 1687 network and can perform on-chip pattern retargeting on arbitrary networks. In addition, it can perform localization of instrument interrupts that are propagated via multi-mode IEEE 1687 networks.",
keywords = "IEEE 1687, IJTAG, Embedded instruments, Dependability, Reliability, Functional safety",
author = "Ibrahim, {Ahmed M.Y.} and Kerkhoff, {Hans G.}",
year = "2019",
month = "9",
day = "3",
doi = "10.1109/ITC-Asia.2019.00032",
language = "English",
isbn = "978-1-7281-4719-2",
booktitle = "2019 IEEE International Test Conference in Asia (ITC-Asia)",
publisher = "IEEE",
address = "United States",

}

Ibrahim, AMY & Kerkhoff, HG 2019, An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. in 2019 IEEE International Test Conference in Asia (ITC-Asia)., 8871531, IEEE, Piscataway, NJ, 2019 IEEE International Test Conference in Asia, ITC-Asia, Tokyo, Japan, 3/09/19. https://doi.org/10.1109/ITC-Asia.2019.00032

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. / Ibrahim, Ahmed M.Y.; Kerkhoff, Hans G.

2019 IEEE International Test Conference in Asia (ITC-Asia). Piscataway, NJ : IEEE, 2019. 8871531.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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AB - The IEEE 1687 standard defines a standardized mechanism for the off-chip access of embedded instruments. A subset of these instruments are also used for maintaining the reliability and functional safety of the chip during its lifetime. For example, temperature sensors, voltage monitors and Built-In-Self-Test engines. In this paper, we present a novel on-chip controller for IEEE 1687 networks which can execute instrument procedures documented in the IEEE 1687 PDL language. These procedures are incorporated within the reliability and functional safety embedded software that uses the measurements data of the instruments. The controller includes an efficient structural model of the IEEE 1687 network and can perform on-chip pattern retargeting on arbitrary networks. In addition, it can perform localization of instrument interrupts that are propagated via multi-mode IEEE 1687 networks.

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