Abstract
| Original language | English |
|---|---|
| Title of host publication | 2019 IEEE International Test Conference in Asia (ITC-Asia) |
| Place of Publication | Piscataway, NJ |
| Publisher | IEEE |
| Number of pages | 6 |
| ISBN (Electronic) | 978-1-7281-4718-5 |
| ISBN (Print) | 978-1-7281-4719-2 |
| DOIs | |
| Publication status | Published - 3 Sep 2019 |
| Event | 2019 IEEE International Test Conference in Asia, ITC-Asia - Tokyo, Japan Duration: 3 Sep 2019 → 5 Sep 2019 |
Conference
| Conference | 2019 IEEE International Test Conference in Asia, ITC-Asia |
|---|---|
| Abbreviated title | ITC-Asia |
| Country | Japan |
| City | Tokyo |
| Period | 3/09/19 → 5/09/19 |
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Keywords
- IEEE 1687
- IJTAG
- Embedded instruments
- Dependability
- Reliability
- Functional safety
Cite this
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An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. / Ibrahim, Ahmed M.Y.; Kerkhoff, Hans G.
2019 IEEE International Test Conference in Asia (ITC-Asia). Piscataway, NJ : IEEE, 2019. 8871531.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
TY - GEN
T1 - An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips
AU - Ibrahim, Ahmed M.Y.
AU - Kerkhoff, Hans G.
PY - 2019/9/3
Y1 - 2019/9/3
N2 - The IEEE 1687 standard defines a standardized mechanism for the off-chip access of embedded instruments. A subset of these instruments are also used for maintaining the reliability and functional safety of the chip during its lifetime. For example, temperature sensors, voltage monitors and Built-In-Self-Test engines. In this paper, we present a novel on-chip controller for IEEE 1687 networks which can execute instrument procedures documented in the IEEE 1687 PDL language. These procedures are incorporated within the reliability and functional safety embedded software that uses the measurements data of the instruments. The controller includes an efficient structural model of the IEEE 1687 network and can perform on-chip pattern retargeting on arbitrary networks. In addition, it can perform localization of instrument interrupts that are propagated via multi-mode IEEE 1687 networks.
AB - The IEEE 1687 standard defines a standardized mechanism for the off-chip access of embedded instruments. A subset of these instruments are also used for maintaining the reliability and functional safety of the chip during its lifetime. For example, temperature sensors, voltage monitors and Built-In-Self-Test engines. In this paper, we present a novel on-chip controller for IEEE 1687 networks which can execute instrument procedures documented in the IEEE 1687 PDL language. These procedures are incorporated within the reliability and functional safety embedded software that uses the measurements data of the instruments. The controller includes an efficient structural model of the IEEE 1687 network and can perform on-chip pattern retargeting on arbitrary networks. In addition, it can perform localization of instrument interrupts that are propagated via multi-mode IEEE 1687 networks.
KW - IEEE 1687
KW - IJTAG
KW - Embedded instruments
KW - Dependability
KW - Reliability
KW - Functional safety
U2 - 10.1109/ITC-Asia.2019.00032
DO - 10.1109/ITC-Asia.2019.00032
M3 - Conference contribution
SN - 978-1-7281-4719-2
BT - 2019 IEEE International Test Conference in Asia (ITC-Asia)
PB - IEEE
CY - Piscataway, NJ
ER -