An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips

Ahmed M.Y. Ibrahim*, Hans G. Kerkhoff

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    Abstract

    The IEEE 1687 standard defines a standardized mechanism for the off-chip access of embedded instruments. A subset of these instruments are also used for maintaining the reliability and functional safety of the chip during its lifetime. For example, temperature sensors, voltage monitors and Built-In-Self-Test engines. In this paper, we present a novel on-chip controller for IEEE 1687 networks which can execute instrument procedures documented in the IEEE 1687 PDL language. These procedures are incorporated within the reliability and functional safety embedded software that uses the measurements data of the instruments. The controller includes an efficient structural model of the IEEE 1687 network and can perform on-chip pattern retargeting on arbitrary networks. In addition, it can perform localization of instrument interrupts that are propagated via multi-mode IEEE 1687 networks.
    Original languageEnglish
    Title of host publication2019 IEEE International Test Conference in Asia (ITC-Asia)
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Number of pages6
    ISBN (Electronic)978-1-7281-4718-5
    ISBN (Print)978-1-7281-4719-2
    DOIs
    Publication statusPublished - 3 Sep 2019
    Event2019 IEEE International Test Conference in Asia, ITC-Asia - Tokyo, Japan
    Duration: 3 Sep 20195 Sep 2019

    Conference

    Conference2019 IEEE International Test Conference in Asia, ITC-Asia
    Abbreviated titleITC-Asia
    CountryJapan
    CityTokyo
    Period3/09/195/09/19

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    Keywords

    • IEEE 1687
    • IJTAG
    • Embedded instruments
    • Dependability
    • Reliability
    • Functional safety

    Cite this

    Ibrahim, A. M. Y., & Kerkhoff, H. G. (2019). An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. In 2019 IEEE International Test Conference in Asia (ITC-Asia) [8871531] Piscataway, NJ: IEEE. https://doi.org/10.1109/ITC-Asia.2019.00032