An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips

Ahmed M.Y. Ibrahim; Hans G. Kerkhoff

doi:10.1109/ITC-Asia.2019.00032

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips

Ahmed M.Y. Ibrahim^*, Hans G. Kerkhoff

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

230 Downloads (Pure)

Abstract

The IEEE 1687 standard defines a standardized mechanism for the off-chip access of embedded instruments. A subset of these instruments are also used for maintaining the reliability and functional safety of the chip during its lifetime. For example, temperature sensors, voltage monitors and Built-In-Self-Test engines. In this paper, we present a novel on-chip controller for IEEE 1687 networks which can execute instrument procedures documented in the IEEE 1687 PDL language. These procedures are incorporated within the reliability and functional safety embedded software that uses the measurements data of the instruments. The controller includes an efficient structural model of the IEEE 1687 network and can perform on-chip pattern retargeting on arbitrary networks. In addition, it can perform localization of instrument interrupts that are propagated via multi-mode IEEE 1687 networks.

Original language	English
Title of host publication	2019 IEEE International Test Conference in Asia (ITC-Asia)
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	109-114
Number of pages	6
ISBN (Electronic)	978-1-7281-4718-5
ISBN (Print)	978-1-7281-4719-2
DOIs	https://doi.org/10.1109/ITC-Asia.2019.00032
Publication status	Published - 3 Sep 2019
Event	2019 IEEE International Test Conference in Asia, ITC-Asia 2019 - Tokyo, Japan Duration: 3 Sep 2019 → 5 Sep 2019

Conference

Conference	2019 IEEE International Test Conference in Asia, ITC-Asia 2019
Abbreviated title	ITC-Asia
Country/Territory	Japan
City	Tokyo
Period	3/09/19 → 5/09/19

Keywords

IEEE 1687
IJTAG
Embedded instruments
Dependability
Reliability
Functional safety

Access to Document

10.1109/ITC-Asia.2019.00032

Ibrahim2019on-chipAccepted author version, 3.86 MB

Cite this

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title = "An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips",

abstract = "The IEEE 1687 standard defines a standardized mechanism for the off-chip access of embedded instruments. A subset of these instruments are also used for maintaining the reliability and functional safety of the chip during its lifetime. For example, temperature sensors, voltage monitors and Built-In-Self-Test engines. In this paper, we present a novel on-chip controller for IEEE 1687 networks which can execute instrument procedures documented in the IEEE 1687 PDL language. These procedures are incorporated within the reliability and functional safety embedded software that uses the measurements data of the instruments. The controller includes an efficient structural model of the IEEE 1687 network and can perform on-chip pattern retargeting on arbitrary networks. In addition, it can perform localization of instrument interrupts that are propagated via multi-mode IEEE 1687 networks.",

keywords = "IEEE 1687, IJTAG, Embedded instruments, Dependability, Reliability, Functional safety",

author = "Ibrahim, {Ahmed M.Y.} and Kerkhoff, {Hans G.}",

year = "2019",

month = sep,

day = "3",

doi = "10.1109/ITC-Asia.2019.00032",

language = "English",

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pages = "109--114",

booktitle = "2019 IEEE International Test Conference in Asia (ITC-Asia)",

publisher = "IEEE",

address = "United States",

note = "2019 IEEE International Test Conference in Asia, ITC-Asia 2019, ITC-Asia ; Conference date: 03-09-2019 Through 05-09-2019",

}

Ibrahim, AMY & Kerkhoff, HG 2019, An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. in 2019 IEEE International Test Conference in Asia (ITC-Asia)., 8871531, IEEE, Piscataway, NJ, pp. 109-114, 2019 IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, 3/09/19. https://doi.org/10.1109/ITC-Asia.2019.00032

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. / Ibrahim, Ahmed M.Y.; Kerkhoff, Hans G.

2019 IEEE International Test Conference in Asia (ITC-Asia). Piscataway, NJ : IEEE, 2019. p. 109-114 8871531.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Kerkhoff, Hans G.

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AB - The IEEE 1687 standard defines a standardized mechanism for the off-chip access of embedded instruments. A subset of these instruments are also used for maintaining the reliability and functional safety of the chip during its lifetime. For example, temperature sensors, voltage monitors and Built-In-Self-Test engines. In this paper, we present a novel on-chip controller for IEEE 1687 networks which can execute instrument procedures documented in the IEEE 1687 PDL language. These procedures are incorporated within the reliability and functional safety embedded software that uses the measurements data of the instruments. The controller includes an efficient structural model of the IEEE 1687 network and can perform on-chip pattern retargeting on arbitrary networks. In addition, it can perform localization of instrument interrupts that are propagated via multi-mode IEEE 1687 networks.

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KW - IJTAG

KW - Embedded instruments

KW - Dependability

KW - Reliability

KW - Functional safety

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M3 - Conference contribution

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BT - 2019 IEEE International Test Conference in Asia (ITC-Asia)

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Y2 - 3 September 2019 through 5 September 2019

ER -

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips

Abstract

Conference

Keywords

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