An optimization model for test assembly to match observed-score distributions

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic

Original language	English
Title of host publication	Objective measurement
Subtitle of host publication	Theory into practice
Editors	Mark Wilson
Place of Publication	Norwood, NJ
Publisher	Ablex
Pages	405-418
Volume	3
ISBN (Print)	0-89391-727-3
Publication status	Published - 1996
Event	5th International Objective Measurement Workshop, IOMW 1989 - University of California, Berkeley, United States Duration: 25 Mar 1989 → 26 Mar 1989 Conference number: 5

Conference	5th International Objective Measurement Workshop, IOMW 1989
Abbreviated title	IOMW 1989
Country/Territory	United States
City	Berkeley
Period	25/03/89 → 26/03/89

Cite this

@inbook{b9d1b363f5d243b9bf7c422b4ab45da5,

title = "An optimization model for test assembly to match observed-score distributions",

author = "{van der Linden}, {Wim J.} and Luecht, {Richard M.}",

year = "1996",

language = "English",

isbn = "0-89391-727-3",

volume = "3",

pages = "405--418",

editor = "Mark Wilson",

booktitle = "Objective measurement",

publisher = "Ablex",

note = "5th International Objective Measurement Workshop, IOMW 1989, IOMW 1989 ; Conference date: 25-03-1989 Through 26-03-1989",

}

TY - CHAP

T1 - An optimization model for test assembly to match observed-score distributions

AU - van der Linden, Wim J.

AU - Luecht, Richard M.

N1 - Conference code: 5

PY - 1996

Y1 - 1996

M3 - Chapter

SN - 0-89391-727-3

VL - 3

SP - 405

EP - 418

BT - Objective measurement

A2 - Wilson, Mark

PB - Ablex

CY - Norwood, NJ

T2 - 5th International Objective Measurement Workshop, IOMW 1989

Y2 - 25 March 1989 through 26 March 1989

ER -