An optimization model for test assembly to match observed-score distributions

Wim J. van der Linden, Richard M. Luecht

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

    Original languageEnglish
    Title of host publicationObjective measurement
    Subtitle of host publicationTheory into practice
    EditorsMark Wilson
    Place of PublicationNorwood, NJ
    PublisherAblex
    Pages405-418
    Volume3
    ISBN (Print)0-89391-727-3
    Publication statusPublished - 1996
    Event5th International Objective Measurement Workshop, IOMW 1989 - University of California, Berkeley, United States
    Duration: 25 Mar 198926 Mar 1989
    Conference number: 5

    Conference

    Conference5th International Objective Measurement Workshop, IOMW 1989
    Abbreviated titleIOMW 1989
    CountryUnited States
    CityBerkeley
    Period25/03/8926/03/89

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