An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds?

Bruno Endres Forlin*, Wouter van Huffelen, Carlo Cazzaniga, Paolo Rech, Nikolaos Alachiotis, Marco Ottavi

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
119 Downloads (Pure)

Abstract

Fast development, low cost, and reconfigurability are becoming critical factors for aerospace applications, making SRAM FPGAs attractive. However, SRAM FPGAs are prone to errors in the user and on the configuration bits. For their correct functioning, they must be capable of withstanding failures without sacrificing much performance. When adjusting a soft core for these applications, it is essential to know where redundancies are necessary, to avoid unnecessary overhead. We characterize the reliability of an unprotected RISC-V microcontroller using an accelerated neutron beam. Our investigation shows that, for our chosen benchmark and processor, the user data in the memory banks is the leading cause of the total number of errors in the application. By reversing the benchmark operations, we could root cause the origin of the observed errors and found that most of the data corruption detected during the runs stem from previously corrupt input data or from output data that were corrupted while transmitting.

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE European Test Symposium, ETS 2023
Place of PublicationPiscataway, NJ
PublisherIEEE
Number of pages6
ISBN (Electronic)979-8-3503-3634-4, 979-8-3503-3633-7 (USB)
ISBN (Print)979-8-3503-3635-1
DOIs
Publication statusPublished - 2023
Event28th IEEE European Test Symposium, ETS 2023 - Venice, Italy
Duration: 22 May 202326 May 2023
Conference number: 28

Publication series

NameProceedings IEEE European Test Symposium (ETS)
PublisherIEEE
Volume2023
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780

Conference

Conference28th IEEE European Test Symposium, ETS 2023
Abbreviated titleETS 2023
Country/TerritoryItaly
CityVenice
Period22/05/2326/05/23

Keywords

  • 2023 OA procedure
  • Reliability
  • RISC-V
  • Soft core
  • Soft errors
  • Neutron beam

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