Analog Design-to-Test Integration

N. Engin, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE Circuits, Systems and Signal Processing (CSSP'98)
    Place of PublicationMierlo, the Netherlands
    Pages161-164
    Number of pages4
    Publication statusPublished - 1 Nov 1998

    Keywords

    • METIS-112990

    Cite this

    Engin, N., Tangelder, R. J. W. T., & Kerkhoff, H. G. (1998). Analog Design-to-Test Integration. In Proceedings of the IEEE Circuits, Systems and Signal Processing (CSSP'98) (pp. 161-164). Mierlo, the Netherlands.