Analog Design-to-Test Integration: An Advanced Approach

N. Engin, Hans G. Kerkhoff, R.J.W.T. Tangelder, H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 4th IEEE International Mixed Signal Testing Workshop
    Place of PublicationThe Hague, the Netherlands
    Number of pages4
    Publication statusPublished - 9 Jun 1998


    • METIS-112995

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