Analog Design-to-Test Integration: An Advanced Approach

N. Engin, Hans G. Kerkhoff, R.J.W.T. Tangelder, H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 4th IEEE International Mixed Signal Testing Workshop
    Place of PublicationThe Hague, the Netherlands
    Pages152-155
    Number of pages4
    Publication statusPublished - 9 Jun 1998

    Keywords

    • METIS-112995

    Cite this

    Engin, N., Kerkhoff, H. G., Tangelder, R. J. W. T., & Speek, H. (1998). Analog Design-to-Test Integration: An Advanced Approach. In Proceedings of the 4th IEEE International Mixed Signal Testing Workshop (pp. 152-155). The Hague, the Netherlands.