Analog Design-to-Test Integration

N. Engin, R.J.W.T. Tangelder, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the IEEE Circuits, Systems and Signal Processing (CSSP'98)
Place of Publication	Mierlo, the Netherlands
Pages	161-164
Number of pages	4
Publication status	Published - 1 Nov 1998

Keywords

@inproceedings{4829c6d1fd154c80b25037c5369c6b4d,

title = "Analog Design-to-Test Integration",

keywords = "METIS-112990",

author = "N. Engin and R.J.W.T. Tangelder and Kerkhoff, \{Hans G.\}",

year = "1998",

month = nov,

day = "1",

language = "Undefined",

isbn = "90-73461-15-4",

pages = "161--164",

booktitle = "Proceedings of the IEEE Circuits, Systems and Signal Processing (CSSP'98)",

}