Analysis and contribution of stress anisotropy in epitaxial hard ferrite thin films

A. Lisfi, L.T. Nguyen, J.C. Lodder, C.M. Williams, H. Corcoran, P. Chang, A. Johnson, W. Morgan

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    Abstract

    The stress anisotropy in epitaxial hard ferrites thin films (BaFe12O19, CoFe2O4) has been investigated using two methods. (a) The thickness dependence of torque curves and magnetic hysteresis loops. (b) The comparison between magnetic and magneto-optic Kerr hysteresis loops. Both analyses confirm the domination of stress in CoFe2O4 whereas in BaFe12O19 films the stress is too weak to compete with magnetocrystalline anisotropy.
    Original languageUndefined
    Pages (from-to)219-222
    Number of pages4
    JournalJournal of magnetism and magnetic materials
    Volume290-291
    Issue number2005
    DOIs
    Publication statusPublished - 2005

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • EWI-5532
    • SMI-MAT: MATERIALS
    • METIS-224553
    • Thin Films
    • Magnetic anisotropy
    • Hystersis loop
    • Torque curve
    • Kerr effect
    • IR-62991

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