Analysis of ion specific effects in the tip-sample force of silica surfaces by static and dynamic for spectroscopy

Research output: Contribution to conference › Poster › Other research output

Original language	English
Publication status	Published - 30 Aug 2010
Event	Seeing at the Nanoscale International Conference VIII 2010 - Basel, Switzerland Duration: 30 Aug 2010 → 1 Sept 2010 Conference number: 8

Conference	Seeing at the Nanoscale International Conference VIII 2010
Country/Territory	Switzerland
City	Basel
Period	30/08/10 → 1/09/10

Cite this

@conference{8ff75b063804427d8b8cfd6657043102,

title = "Analysis of ion specific effects in the tip-sample force of silica surfaces by static and dynamic for spectroscopy",

author = "Daniel Ebeling and Mugele, {Frieder G.}",

year = "2010",

month = aug,

day = "30",

language = "English",

note = "Seeing at the Nanoscale International Conference VIII 2010 ; Conference date: 30-08-2010 Through 01-09-2010",

}