Analysis of ion specific effects in the tip-sample force of silica surfaces by static and dynamic for spectroscopy

Daniel Ebeling, Frieder G. Mugele

Research output: Contribution to conferencePosterOther research output

Original languageEnglish
Publication statusPublished - 30 Aug 2010
EventSeeing at the Nanoscale International Conference VIII 2010 - Basel, Switzerland
Duration: 30 Aug 20101 Sep 2010
Conference number: 8

Conference

ConferenceSeeing at the Nanoscale International Conference VIII 2010
CountrySwitzerland
CityBasel
Period30/08/101/09/10

Cite this