Analysis of stray capacitance in the Kelvin method

I.D. Baikie, E. Venderbosch, J.A. Meyer, P.J. Estrup

Research output: Contribution to journal › Article › Academic › peer-review

64 Citations (Scopus)

Original language	Undefined
Pages (from-to)	725-735
Number of pages	11
Journal	Review of scientific instruments
Volume	0
Issue number	62
Publication status	Published - 1991

Baikie, I. D., Venderbosch, E., Meyer, J. A., & Estrup, P. J. (1991). Analysis of stray capacitance in the Kelvin method. Review of scientific instruments, 0(62), 725-735.

@article{31123602963f416c919c299d1cc2d0d5,

title = "Analysis of stray capacitance in the Kelvin method",

keywords = "METIS-128953",

author = "I.D. Baikie and E. Venderbosch and J.A. Meyer and P.J. Estrup",

year = "1991",

language = "Undefined",

volume = "0",

pages = "725--735",

journal = "Review of scientific instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "62",

}