Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization

I.I. Soloviev, N.V. Klenov, A. E. Schegolev, S. V. Bakurskiy, M. Yu Kupriyanov, M. V. Tereshonok, A. A. Golubov

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

We derived inductance-dependent expressions for time-averaged voltage-flux and voltage-current dependencies of Low-Tc DC SQUID. Utilization of these expressions speeds up optimization of real devices and expands possibilities for their analytical study. Optimization of voltage response linearity of two SQUIDs connected in series is presented as an example of application of the proposed analytics.

Original languageEnglish
Title of host publication2017 16th International Superconductive Electronics Conference, ISEC 2017
PublisherIEEE
Pages1-3
Number of pages3
Volume2018-January
ISBN (Electronic)9781509058686
DOIs
Publication statusPublished - 9 Mar 2018
Event16th International Superconductive Electronics Conference, ISEC 2017 - Sorrento, Italy
Duration: 12 Jun 201716 Jun 2017
Conference number: 16
http://www.isec2017.org/

Conference

Conference16th International Superconductive Electronics Conference, ISEC 2017
Abbreviated titleISEC
CountryItaly
CitySorrento
Period12/06/1716/06/17
Internet address

Fingerprint

SQUIDs
linearization
Linearization
direct current
Electric potential
electric potential
optimization
inductance
Inductance
linearity
Fluxes

Keywords

  • DC SQUID
  • linearity
  • voltage response

Cite this

Soloviev, I. I., Klenov, N. V., Schegolev, A. E., Bakurskiy, S. V., Kupriyanov, M. Y., Tereshonok, M. V., & Golubov, A. A. (2018). Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization. In 2017 16th International Superconductive Electronics Conference, ISEC 2017 (Vol. 2018-January, pp. 1-3). IEEE. https://doi.org/10.1109/ISEC.2017.8314221
Soloviev, I.I. ; Klenov, N.V. ; Schegolev, A. E. ; Bakurskiy, S. V. ; Kupriyanov, M. Yu ; Tereshonok, M. V. ; Golubov, A. A. / Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization. 2017 16th International Superconductive Electronics Conference, ISEC 2017. Vol. 2018-January IEEE, 2018. pp. 1-3
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abstract = "We derived inductance-dependent expressions for time-averaged voltage-flux and voltage-current dependencies of Low-Tc DC SQUID. Utilization of these expressions speeds up optimization of real devices and expands possibilities for their analytical study. Optimization of voltage response linearity of two SQUIDs connected in series is presented as an example of application of the proposed analytics.",
keywords = "DC SQUID, linearity, voltage response",
author = "I.I. Soloviev and N.V. Klenov and Schegolev, {A. E.} and Bakurskiy, {S. V.} and Kupriyanov, {M. Yu} and Tereshonok, {M. V.} and Golubov, {A. A.}",
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Soloviev, II, Klenov, NV, Schegolev, AE, Bakurskiy, SV, Kupriyanov, MY, Tereshonok, MV & Golubov, AA 2018, Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization. in 2017 16th International Superconductive Electronics Conference, ISEC 2017. vol. 2018-January, IEEE, pp. 1-3, 16th International Superconductive Electronics Conference, ISEC 2017, Sorrento, Italy, 12/06/17. https://doi.org/10.1109/ISEC.2017.8314221

Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization. / Soloviev, I.I.; Klenov, N.V.; Schegolev, A. E.; Bakurskiy, S. V.; Kupriyanov, M. Yu; Tereshonok, M. V.; Golubov, A. A.

2017 16th International Superconductive Electronics Conference, ISEC 2017. Vol. 2018-January IEEE, 2018. p. 1-3.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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T1 - Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization

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Soloviev II, Klenov NV, Schegolev AE, Bakurskiy SV, Kupriyanov MY, Tereshonok MV et al. Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization. In 2017 16th International Superconductive Electronics Conference, ISEC 2017. Vol. 2018-January. IEEE. 2018. p. 1-3 https://doi.org/10.1109/ISEC.2017.8314221