Abstract
Nuclear analytical techniques (PIXE, RBS and ERDA) have been applied to investigate diffusion processes in polymer light-emitting diodes (PLEDs), employing a 30 MeV AVF cyclotron. The techniques prove to be useful in identifying the origin of the diffusion process and the nature of molecules transported from the hole injecting ITO electrode into the polymer layer.
Original language | English |
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Pages (from-to) | 687-690 |
Number of pages | 4 |
Journal | Bulletin of Materials Science |
Volume | 22 |
Issue number | 3 |
DOIs | |
Publication status | Published - May 1999 |
Externally published | Yes |
Keywords
- n/a OA procedure