Analyzing the precision of JSW measurements using 3D scans and statistical models

T.T. Withaar, J.A. Kauffman, H.J. Bernelot Moens

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    13 Downloads (Pure)

    Abstract

    One of the methods to diagnose rheumatoid arthritis (RA) ismeasuring joint space narrowing over time. A method is presentedto analyze the sensitivity of this measurement to positioningof the hand. Micro-CT scans are used to generate projectionsof a joint under varying angles of rotation. A semi-automaticmethod is used to measure the joint space width (JSW) for eachprojection. A Statistical model is used to investigate whether therotation can be detected from a 2D radiograph. It is shown thatrotation of the hand has a significant influence on the measured JSW.
    Original languageEnglish
    Title of host publicationProceedings of SPS-DARTS 2006 the second annual IEEE Benelux/DSP Valley Signal Processing Symposium
    EditorsW. Philips
    PublisherIEEE EMBS Benelux Chapter
    Pages123-126
    Number of pages4
    ISBN (Print)978-90-73461-44-4
    Publication statusPublished - 28 Mar 2006
    Event2nd Annual IEEE BENELUX/DSP Valley Signal Processing Symposium, SPS-DARTS 2006 - Antwerp, Belgium
    Duration: 28 Mar 200629 Mar 2006
    Conference number: 2

    Conference

    Conference2nd Annual IEEE BENELUX/DSP Valley Signal Processing Symposium, SPS-DARTS 2006
    Abbreviated titleSPS-DARTS
    CountryBelgium
    CityAntwerp
    Period28/03/0629/03/06

    Keywords

    • EWI-8991
    • METIS-237893
    • IR-66851

    Fingerprint Dive into the research topics of 'Analyzing the precision of JSW measurements using 3D scans and statistical models'. Together they form a unique fingerprint.

  • Cite this

    Withaar, T. T., Kauffman, J. A., & Bernelot Moens, H. J. (2006). Analyzing the precision of JSW measurements using 3D scans and statistical models. In W. Philips (Ed.), Proceedings of SPS-DARTS 2006 the second annual IEEE Benelux/DSP Valley Signal Processing Symposium (pp. 123-126). IEEE EMBS Benelux Chapter.