Abstract
We report an anisotropic misfit stress relief mechanism in thin La0.67Sr0.33MnO3 (LSMO) films coherently grown on NdGaO3(110) substrates. These results are uniquely related to the orthorhombicity of the LSMO. The x-ray diffraction measurements and quantitative simulations demonstrate that biaxial mismatch stress is relieved differently along in-plane directions perpendicular to each other: in the [1math0] direction stress is accommodated by decrease of the γ angle of the orthorhombic LSMO unit cell, while in the [001] direction stress is partially relieved by periodic lattice modulations.
Original language | Undefined |
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Pages (from-to) | 152508- |
Journal | Applied physics letters |
Volume | 95 |
Issue number | 15 |
DOIs | |
Publication status | Published - 2009 |
Keywords
- IR-72412
- METIS-260484