Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation

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    Abstract

    In this paper, functional IDDQ testing has been applied for a 90nm VLIW processor to effectively detect aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test environment for validation, implementing an accelerated test (AT), has been investigated and IDDQ measurement data resulting from AT is presented. It is found that the quiescent current for the processor characterizes power degradation with a coefficient of -0.025 with the aging trend. This is in coherence with behaviour of the NBTI aging mechanism, but contradicting other mechanisms such as TDDB. It shows the NBTI aging is the dominant factor for processor technology of 90nm and beyond.
    Original languageUndefined
    Title of host publication10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2015)
    EditorsYong Zhao
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Pages1-5
    Number of pages5
    ISBN (Print)978-1-4799-1999-4
    DOIs
    Publication statusPublished - 2015

    Publication series

    Name
    PublisherIEEE Computer Society

    Keywords

    • EWI-26191
    • nano electronics
    • functional testing
    • reliability testing
    • METIS-312688
    • IDDQ testing
    • NBTI
    • IR-96788
    • Aging
    • DSP processor

    Cite this

    Kerkhoff, H. G. (2015). Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation. In Y. Zhao (Ed.), 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2015) (pp. 1-5). USA: IEEE Computer Society. https://doi.org/10.1109/DTIS.2015.7127359