Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation

Hans G. Kerkhoff

doi:10.1109/DTIS.2015.7127359

Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation

Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (Scopus)

8 Downloads (Pure)

Abstract

In this paper, functional IDDQ testing has been applied for a 90nm VLIW processor to effectively detect aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test environment for validation, implementing an accelerated test (AT), has been investigated and IDDQ measurement data resulting from AT is presented. It is found that the quiescent current for the processor characterizes power degradation with a coefficient of -0.025 with the aging trend. This is in coherence with behaviour of the NBTI aging mechanism, but contradicting other mechanisms such as TDDB. It shows the NBTI aging is the dominant factor for processor technology of 90nm and beyond.

Original language	Undefined
Title of host publication	10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2015)
Editors	Yong Zhao
Place of Publication	USA
Publisher	IEEE
Pages	1-5
Number of pages	5
ISBN (Print)	978-1-4799-1999-4
DOIs	https://doi.org/10.1109/DTIS.2015.7127359
Publication status	Published - 2015
Event	10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015 - Napoli, Italy Duration: 21 Apr 2015 → 23 Apr 2015 Conference number: 10

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015
Abbreviated title	DTIS 2015
Country/Territory	Italy
City	Napoli
Period	21/04/15 → 23/04/15

Keywords

EWI-26191
nano electronics
functional testing
reliability testing
METIS-312688
IDDQ testing
NBTI
IR-96788
Aging
DSP processor

Access to Document

10.1109/DTIS.2015.7127359

http://eprints.eemcs.utwente.nl/secure2/26191/01/DTIS2015_camera_ready.pdf

Cite this

@inproceedings{dc13cc0a3c2f4181b61734cc0baadbef,

title = "Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation",

abstract = "In this paper, functional IDDQ testing has been applied for a 90nm VLIW processor to effectively detect aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test environment for validation, implementing an accelerated test (AT), has been investigated and IDDQ measurement data resulting from AT is presented. It is found that the quiescent current for the processor characterizes power degradation with a coefficient of -0.025 with the aging trend. This is in coherence with behaviour of the NBTI aging mechanism, but contradicting other mechanisms such as TDDB. It shows the NBTI aging is the dominant factor for processor technology of 90nm and beyond.",

keywords = "EWI-26191, nano electronics, functional testing, reliability testing, METIS-312688, IDDQ testing, NBTI, IR-96788, Aging, DSP processor",

author = "Kerkhoff, {Hans G.}",

note = "eemcs-eprint-26191 ; 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015 ; Conference date: 21-04-2015 Through 23-04-2015",

year = "2015",

doi = "10.1109/DTIS.2015.7127359",

language = "Undefined",

isbn = "978-1-4799-1999-4",

publisher = "IEEE",

pages = "1--5",

editor = "Yong Zhao",

booktitle = "10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2015)",

address = "United States",

}

Kerkhoff, HG 2015, Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation. in Y Zhao (ed.), 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2015). IEEE, USA, pp. 1-5, 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015, Napoli, Italy, 21/04/15. https://doi.org/10.1109/DTIS.2015.7127359

Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation. / Kerkhoff, Hans G.
10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2015). ed. / Yong Zhao. USA: IEEE, 2015. p. 1-5.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AB - In this paper, functional IDDQ testing has been applied for a 90nm VLIW processor to effectively detect aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test environment for validation, implementing an accelerated test (AT), has been investigated and IDDQ measurement data resulting from AT is presented. It is found that the quiescent current for the processor characterizes power degradation with a coefficient of -0.025 with the aging trend. This is in coherence with behaviour of the NBTI aging mechanism, but contradicting other mechanisms such as TDDB. It shows the NBTI aging is the dominant factor for processor technology of 90nm and beyond.

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