Application of Mid-Infrared Attenuated Total Reflectance spectroscopy Using Broadly Tunable OPOs

Albert F. Nieuwenhuis; Christopher James Lee; Petrus J.M. van der Slot; P. Gross; I.D. Lindsay; Klaus J. Boller

Application of Mid-Infrared Attenuated Total Reflectance spectroscopy Using Broadly Tunable OPOs

Albert F. Nieuwenhuis, Christopher James Lee, Petrus J.M. van der Slot, P. Gross, I.D. Lindsay, Klaus J. Boller

Laser Physics & Nonlinear Optics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics
Place of Publication	San Jose, California, USA
Pages	4551811-
Publication status	Published - 4 May 2008
Event	Conference on Lasers and Electro-Optics, CLEO/QELS 2008 - San Jose, United States Duration: 4 May 2008 → 9 May 2008

Publication series

Name
Volume	4551811

Conference

Conference	Conference on Lasers and Electro-Optics, CLEO/QELS 2008
Abbreviated title	CLEO/QELS
Country	United States
City	San Jose
Period	4/05/08 → 9/05/08

Keywords

METIS-266552

Cite this

@inproceedings{42d998871acd449b8e9e8d01c759b45f,

title = "Application of Mid-Infrared Attenuated Total Reflectance spectroscopy Using Broadly Tunable OPOs",

keywords = "METIS-266552",

author = "Nieuwenhuis, {Albert F.} and Lee, {Christopher James} and {van der Slot}, {Petrus J.M.} and P. Gross and I.D. Lindsay and Boller, {Klaus J.}",

year = "2008",

month = may,

day = "4",

language = "Undefined",

pages = "4551811--",

booktitle = "2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics",

note = "null ; Conference date: 04-05-2008 Through 09-05-2008",

}

Nieuwenhuis, AF , Lee, CJ , van der Slot, PJM, Gross, P, Lindsay, ID & Boller, KJ 2008, Application of Mid-Infrared Attenuated Total Reflectance spectroscopy Using Broadly Tunable OPOs. in 2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics. San Jose, California, USA, pp. 4551811-, Conference on Lasers and Electro-Optics, CLEO/QELS 2008, San Jose, United States, 4/05/08.

Application of Mid-Infrared Attenuated Total Reflectance spectroscopy Using Broadly Tunable OPOs. / Nieuwenhuis, Albert F.; Lee, Christopher James ; van der Slot, Petrus J.M.; Gross, P.; Lindsay, I.D.; Boller, Klaus J.

2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics. San Jose, California, USA, 2008. p. 4551811-.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Application of Mid-Infrared Attenuated Total Reflectance spectroscopy Using Broadly Tunable OPOs

AU - Nieuwenhuis, Albert F.

AU - Lee, Christopher James

AU - van der Slot, Petrus J.M.

AU - Gross, P.

AU - Lindsay, I.D.

AU - Boller, Klaus J.

PY - 2008/5/4

Y1 - 2008/5/4

KW - METIS-266552

M3 - Conference contribution

SP - 4551811-

BT - 2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics

CY - San Jose, California, USA

Y2 - 4 May 2008 through 9 May 2008

ER -