Assessing fit of latent regression models

S. Sinharay, M. von Davier, Z. Guo, Bernard P. Veldkamp

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

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Original language	English
Title of host publication	Issues and Methodologies in Large-Scale Assessments
Editors	M. von Davier, D. Hastedt
Place of Publication	Princeton, NJ
Publisher	IEA-ETS Research Institute
Pages	35-55
ISBN (Print)	978-886854096-8
Publication status	Published - 2010

Name	IERI Monograph Series
Volume	3

Access to Document

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title = "Assessing fit of latent regression models",

author = "S. Sinharay and {von Davier}, M. and Z. Guo and Veldkamp, {Bernard P.}",

year = "2010",

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isbn = "978-886854096-8",

series = "IERI Monograph Series",

publisher = "IEA-ETS Research Institute",

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editor = "{von Davier}, M. and D. Hastedt",

booktitle = "Issues and Methodologies in Large-Scale Assessments",

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TY - CHAP

T1 - Assessing fit of latent regression models

AU - Sinharay, S.

AU - von Davier, M.

AU - Guo, Z.

AU - Veldkamp, Bernard P.

PY - 2010

Y1 - 2010

M3 - Chapter

SN - 978-886854096-8

T3 - IERI Monograph Series

SP - 35

EP - 55

BT - Issues and Methodologies in Large-Scale Assessments

A2 - von Davier, M.

A2 - Hastedt, D.

PB - IEA-ETS Research Institute

CY - Princeton, NJ

ER -