Assessing fit of latent regression models

S. Sinharay; M. von Davier; Z. Guo; Bernard P. Veldkamp

Assessing fit of latent regression models

S. Sinharay, M. von Davier, Z. Guo, Bernard P. Veldkamp

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

Original language	English
Title of host publication	IERI Monograph Series
Editors	M. von Davier, D. Hastedt
Place of Publication	Princeton, NJ
Publisher	IEA-ETS Research Institute
Pages	35-55
ISBN (Print)	978-0-88685-402-7
Publication status	Published - 2010

Publication series

Name	Issues and Methodologies in Large-Scale Assessments
Number	3
Volume	3

Keywords

METIS-272939

Cite this

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title = "Assessing fit of latent regression models",

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author = "S. Sinharay and {von Davier}, M. and Z. Guo and Veldkamp, {Bernard P.}",

year = "2010",

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series = "Issues and Methodologies in Large-Scale Assessments",

publisher = "IEA-ETS Research Institute",

number = "3",

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editor = "{von Davier}, M. and D. Hastedt",

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Assessing fit of latent regression models. / Sinharay, S.; von Davier, M.; Guo, Z.; Veldkamp, Bernard P.

IERI Monograph Series. ed. / M. von Davier; D. Hastedt. Princeton, NJ : IEA-ETS Research Institute, 2010. p. 35-55 (Issues and Methodologies in Large-Scale Assessments; Vol. 3, No. 3).

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

TY - CHAP

T1 - Assessing fit of latent regression models

AU - Sinharay, S.

AU - von Davier, M.

AU - Guo, Z.

AU - Veldkamp, Bernard P.

PY - 2010

Y1 - 2010

KW - METIS-272939

M3 - Chapter

SN - 978-0-88685-402-7

T3 - Issues and Methodologies in Large-Scale Assessments

SP - 35

EP - 55

BT - IERI Monograph Series

A2 - von Davier, M.

A2 - Hastedt, D.

PB - IEA-ETS Research Institute

CY - Princeton, NJ

ER -