Assessing fit of latent regression models

S. Sinharay, M. von Davier, Z. Guo, Bernard P. Veldkamp

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

    Original languageEnglish
    Title of host publicationIERI Monograph Series
    EditorsM. von Davier, D. Hastedt
    Place of PublicationPrinceton, NJ
    PublisherIEA-ETS Research Institute
    Pages35-55
    ISBN (Print)978-0-88685-402-7
    Publication statusPublished - 2010

    Publication series

    NameIssues and Methodologies in Large-Scale Assessments
    Number3
    Volume3

    Keywords

    • METIS-272939

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