Assessing fit of latent regression models

S. Sinharay, M. von Davier, Z. Guo, Bernard P. Veldkamp

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

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    Original languageEnglish
    Title of host publicationIssues and Methodologies in Large-Scale Assessments
    EditorsM. von Davier, D. Hastedt
    Place of PublicationPrinceton, NJ
    PublisherIEA-ETS Research Institute
    ISBN (Print)978-886854096-8
    Publication statusPublished - 2010

    Publication series

    NameIERI Monograph Series

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