Atomic force microscope with integrated optical microscope for biological applications

Constant A.J. Putman, Kees O. van der Werf, Bart G. de Grooth, Niek F. van Hulst, Frans B. Segerink, Jan Greve

Research output: Contribution to journalArticleAcademicpeer-review

45 Citations (Scopus)
195 Downloads (Pure)

Abstract

Since atomic force microscopy (AFM) is capable of imaging nonconducting surfaces, the technique holds great promises for high‐resolution imaging of biological specimens. A disadvantage of most AFMs is the fact that the relatively large sample surface has to be scanned multiple times to pinpoint a specific biological object of interest. Here an AFM is presented which has an incorporated inverted optical microscope. The optical image from the optical microscope is not obscured by the cantilever. Using a XY stage to move the sample, an object is selected with the optical microscope and an AFM image of the selected object can be obtained. AFM images of chromosomes and K562 cells show the potential of the microscope. The microscope further enables a direct comparison between optically observed features and topological information obtained from AFM images.
Original languageEnglish
Pages (from-to)1914-1917
Number of pages3
JournalReview of scientific instruments
Volume63
Issue number3
DOIs
Publication statusPublished - 1992

Fingerprint

Dive into the research topics of 'Atomic force microscope with integrated optical microscope for biological applications'. Together they form a unique fingerprint.

Cite this