Atomic Force Microscopy during Pulsed Laser Deposition

J.J. Broekmaat, G. Rijnders, F.J.G. Roesthuis, A. Brinkman, H. Rogalla, D.H.A. Blank

Research output: Contribution to conferencePosterOther research output

Original languageEnglish
Publication statusPublished - 9 May 2005
EventScanning Probe Microscopy (SPM) Users Meeting 2005 - Nijmegen, Netherlands
Duration: 9 May 20059 May 2005

Conference

ConferenceScanning Probe Microscopy (SPM) Users Meeting 2005
CountryNetherlands
CityNijmegen
Period9/05/059/05/05

Cite this