Atomic Force Microscopy during Pulsed Laser Deposition

J.J. Broekmaat, G. Rijnders, F.J.G. Roesthuis, A. Brinkman, H. Rogalla, D.H.A. Blank

Research output: Contribution to conference › Poster › Other research output

Original language	English
Publication status	Published - 9 May 2005
Event	Scanning Probe Microscopy (SPM) Users Meeting 2005 - Nijmegen, Netherlands Duration: 9 May 2005 → 9 May 2005

Conference	Scanning Probe Microscopy (SPM) Users Meeting 2005
Country/Territory	Netherlands
City	Nijmegen
Period	9/05/05 → 9/05/05

Atomic Force Microscopy during Pulsed Laser Deposition
Broekmaat, J. J., Rijnders, G., Roesthuis, F. J. G., Brinkman, A., Rogalla, H. & Blank, D. H. A., 29 Sept 2005. 1 p.
Research output: Contribution to conference › Poster › Other research output
Atomic Force Microscopy during Pulsed Laser Deposition
Broekmaat, J. J., Rijnders, G., Roesthuis, F. J. G., Brinkman, A., Rogalla, H. & Blank, D. H. A., 13 Aug 2005. 1 p.
Research output: Contribution to conference › Poster › Other research output

Cite this

@conference{7475e37113c14714bf45d9e4ca6f64e8,

title = "Atomic Force Microscopy during Pulsed Laser Deposition",

author = "J.J. Broekmaat and G. Rijnders and F.J.G. Roesthuis and A. Brinkman and H. Rogalla and D.H.A. Blank",

year = "2005",

month = may,

day = "9",

language = "English",

note = "Scanning Probe Microscopy (SPM) Users Meeting 2005 ; Conference date: 09-05-2005 Through 09-05-2005",

}