Atomic force microscopy study of immunogold labeling method

C.R. Neagu, C.A.J. Putman, K. van der Werf, N.F. van Hulst, B.G. de Grooth, J. Greve

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 7 May 1993
EventNEVAC Scanning Probe Microscopy Symposium 1993 - AMOLF, Amsterdam, Netherlands
Duration: 7 May 19937 May 1993

Conference

ConferenceNEVAC Scanning Probe Microscopy Symposium 1993
CountryNetherlands
CityAmsterdam
Period7/05/937/05/93

Cite this

Neagu, C. R., Putman, C. A. J., van der Werf, K., van Hulst, N. F., de Grooth, B. G., & Greve, J. (1993). Atomic force microscopy study of immunogold labeling method. Poster session presented at NEVAC Scanning Probe Microscopy Symposium 1993, Amsterdam, Netherlands.
Neagu, C.R. ; Putman, C.A.J. ; van der Werf, K. ; van Hulst, N.F. ; de Grooth, B.G. ; Greve, J. / Atomic force microscopy study of immunogold labeling method. Poster session presented at NEVAC Scanning Probe Microscopy Symposium 1993, Amsterdam, Netherlands.
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title = "Atomic force microscopy study of immunogold labeling method",
author = "C.R. Neagu and C.A.J. Putman and {van der Werf}, K. and {van Hulst}, N.F. and {de Grooth}, B.G. and J. Greve",
year = "1993",
month = "5",
day = "7",
language = "English",
note = "NEVAC Scanning Probe Microscopy Symposium 1993 ; Conference date: 07-05-1993 Through 07-05-1993",

}

Neagu, CR, Putman, CAJ, van der Werf, K, van Hulst, NF, de Grooth, BG & Greve, J 1993, 'Atomic force microscopy study of immunogold labeling method' NEVAC Scanning Probe Microscopy Symposium 1993, Amsterdam, Netherlands, 7/05/93 - 7/05/93, .

Atomic force microscopy study of immunogold labeling method. / Neagu, C.R.; Putman, C.A.J.; van der Werf, K.; van Hulst, N.F.; de Grooth, B.G.; Greve, J.

1993. Poster session presented at NEVAC Scanning Probe Microscopy Symposium 1993, Amsterdam, Netherlands.

Research output: Contribution to conferencePoster

TY - CONF

T1 - Atomic force microscopy study of immunogold labeling method

AU - Neagu, C.R.

AU - Putman, C.A.J.

AU - van der Werf, K.

AU - van Hulst, N.F.

AU - de Grooth, B.G.

AU - Greve, J.

PY - 1993/5/7

Y1 - 1993/5/7

M3 - Poster

ER -

Neagu CR, Putman CAJ, van der Werf K, van Hulst NF, de Grooth BG, Greve J. Atomic force microscopy study of immunogold labeling method. 1993. Poster session presented at NEVAC Scanning Probe Microscopy Symposium 1993, Amsterdam, Netherlands.