Atomic force microscopy study of immunogold labeling method

C.R. Neagu, C.A.J. Putman, K. van der Werf, N.F. van Hulst, B.G. de Grooth, J. Greve

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 7 May 1993
EventNEVAC Scanning Probe Microscopy Symposium 1993 - AMOLF, Amsterdam, Netherlands
Duration: 7 May 19937 May 1993

Conference

ConferenceNEVAC Scanning Probe Microscopy Symposium 1993
CountryNetherlands
CityAmsterdam
Period7/05/937/05/93

Cite this

Neagu, C. R., Putman, C. A. J., van der Werf, K., van Hulst, N. F., de Grooth, B. G., & Greve, J. (1993). Atomic force microscopy study of immunogold labeling method. Poster session presented at NEVAC Scanning Probe Microscopy Symposium 1993, Amsterdam, Netherlands.