Atomic force microscopy study of immunogold labeling method

C.R. Neagu, C.A.J. Putman, K. van der Werf, N.F. van Hulst, B.G. de Grooth, J. Greve

Research output: Contribution to conference › Poster › Other research output

Original language	English
Publication status	Published - 7 May 1993
Event	NEVAC Scanning Probe Microscopy Symposium 1993 - AMOLF, Amsterdam, Netherlands Duration: 7 May 1993 → 7 May 1993

Conference	NEVAC Scanning Probe Microscopy Symposium 1993
Country/Territory	Netherlands
City	Amsterdam
Period	7/05/93 → 7/05/93

Cite this

@conference{27df080bbb884208b2a411435f792709,

title = "Atomic force microscopy study of immunogold labeling method",

author = "C.R. Neagu and C.A.J. Putman and \{van der Werf\}, K. and \{van Hulst\}, N.F. and \{de Grooth\}, B.G. and J. Greve",

year = "1993",

month = may,

day = "7",

language = "English",

note = "NEVAC Scanning Probe Microscopy Symposium 1993 ; Conference date: 07-05-1993 Through 07-05-1993",

}