Atomic manipulation on semiconductor surfaces at room temperature by Scanning Tunneling Microscopy

Research output: Contribution to journalArticleAcademicpeer-review

10 Downloads (Pure)

Abstract

The scanning tunnelling microscope (STM) can be used as a tool for assembling nanostructures at the atomic level. In this article we briefly review several pathways for controlled manipulation of atoms and molecules on semiconductor surfaces at room temperature. As an illustrative example we discuss the controlled manipulation of atomic platinum chains. We were able to carry the constituting dimers of the atomic Pt chains from point to point with atomic precision at room temperature. Besides the ultimate control of the surface structure we also show that the manipulated Pt dimer can be attached to the apex of the STM tip in various stable configurations.
Original languageUndefined
Pages (from-to)S5-S8
Number of pages4
JournalMicroscopy and analysis (UK Edition)
Volume22
Issue number2
Publication statusPublished - 2008

Keywords

  • IR-73054
  • METIS-249956

Cite this

@article{f9765bd00c8b4359af56524127a8c3aa,
title = "Atomic manipulation on semiconductor surfaces at room temperature by Scanning Tunneling Microscopy",
abstract = "The scanning tunnelling microscope (STM) can be used as a tool for assembling nanostructures at the atomic level. In this article we briefly review several pathways for controlled manipulation of atoms and molecules on semiconductor surfaces at room temperature. As an illustrative example we discuss the controlled manipulation of atomic platinum chains. We were able to carry the constituting dimers of the atomic Pt chains from point to point with atomic precision at room temperature. Besides the ultimate control of the surface structure we also show that the manipulated Pt dimer can be attached to the apex of the STM tip in various stable configurations.",
keywords = "IR-73054, METIS-249956",
author = "{van Houselt}, Arie and Zandvliet, {Henricus J.W.}",
year = "2008",
language = "Undefined",
volume = "22",
pages = "S5--S8",
journal = "Microscopy and analysis (E MEA edition)",
issn = "2049-4424",
publisher = "Wiley",
number = "2",

}

Atomic manipulation on semiconductor surfaces at room temperature by Scanning Tunneling Microscopy. / van Houselt, Arie; Zandvliet, Henricus J.W.

In: Microscopy and analysis (UK Edition), Vol. 22, No. 2, 2008, p. S5-S8.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Atomic manipulation on semiconductor surfaces at room temperature by Scanning Tunneling Microscopy

AU - van Houselt, Arie

AU - Zandvliet, Henricus J.W.

PY - 2008

Y1 - 2008

N2 - The scanning tunnelling microscope (STM) can be used as a tool for assembling nanostructures at the atomic level. In this article we briefly review several pathways for controlled manipulation of atoms and molecules on semiconductor surfaces at room temperature. As an illustrative example we discuss the controlled manipulation of atomic platinum chains. We were able to carry the constituting dimers of the atomic Pt chains from point to point with atomic precision at room temperature. Besides the ultimate control of the surface structure we also show that the manipulated Pt dimer can be attached to the apex of the STM tip in various stable configurations.

AB - The scanning tunnelling microscope (STM) can be used as a tool for assembling nanostructures at the atomic level. In this article we briefly review several pathways for controlled manipulation of atoms and molecules on semiconductor surfaces at room temperature. As an illustrative example we discuss the controlled manipulation of atomic platinum chains. We were able to carry the constituting dimers of the atomic Pt chains from point to point with atomic precision at room temperature. Besides the ultimate control of the surface structure we also show that the manipulated Pt dimer can be attached to the apex of the STM tip in various stable configurations.

KW - IR-73054

KW - METIS-249956

M3 - Article

VL - 22

SP - S5-S8

JO - Microscopy and analysis (E MEA edition)

JF - Microscopy and analysis (E MEA edition)

SN - 2049-4424

IS - 2

ER -