Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interface by Z-contrast imaging

Hye Jung Chang; Sergei V. Kalinin; Anna N. Morozovska; Mark Huijben; Ying-Hao Chu; Pu Yu; Ramamoorthy Ramesh; Evgeny A. Eliseev; George S. Svechnikov; Stephen J. Pennycook; Albina Y. Borisevich

doi:10.1002/adma.201004641

Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interface by Z-contrast imaging

Hye Jung Chang
, Sergei V. Kalinin
, Anna N. Morozovska
, Mark Huijben
, Ying-Hao Chu
, Pu Yu
, Ramamoorthy Ramesh
, Evgeny A. Eliseev
, George S. Svechnikov
, Stephen J. Pennycook
, Albina Y. Borisevich

Research output: Contribution to journal › Article › Academic › peer-review

76 Citations (Scopus)

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Abstract

Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a-STEM image, b-corresponding displacement profile) is combined with Landau-Ginsburg-Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.

Original language	English
Pages (from-to)	2474-2479
Number of pages	6
Journal	Advanced materials
Volume	23
Issue number	21
DOIs	https://doi.org/10.1002/adma.201004641
Publication status	Published - 2011

Keywords

IR-104460
METIS-280817

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10.1002/adma.201004641

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Chang, H. J., Kalinin, S. V., Morozovska, A. N., Huijben, M., Chu, Y.-H., Yu, P., Ramesh, R., Eliseev, E. A., Svechnikov, G. S., Pennycook, S. J., & Borisevich, A. Y. (2011). Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interface by Z-contrast imaging. Advanced materials, 23(21), 2474-2479. https://doi.org/10.1002/adma.201004641

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title = "Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interface by Z-contrast imaging",

abstract = "Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a-STEM image, b-corresponding displacement profile) is combined with Landau-Ginsburg-Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.",

keywords = "IR-104460, METIS-280817",

author = "Chang, \{Hye Jung\} and Kalinin, \{Sergei V.\} and Morozovska, \{Anna N.\} and Mark Huijben and Ying-Hao Chu and Pu Yu and Ramamoorthy Ramesh and Eliseev, \{Evgeny A.\} and Svechnikov, \{George S.\} and Pennycook, \{Stephen J.\} and Borisevich, \{Albina Y.\}",

year = "2011",

doi = "10.1002/adma.201004641",

language = "English",

volume = "23",

pages = "2474--2479",

journal = "Advanced materials",

issn = "0935-9648",

publisher = "Wiley-Blackwell",

number = "21",

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TY - JOUR

T1 - Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interface by Z-contrast imaging

AU - Chang, Hye Jung

AU - Kalinin, Sergei V.

AU - Morozovska, Anna N.

AU - Huijben, Mark

AU - Chu, Ying-Hao

AU - Yu, Pu

AU - Ramesh, Ramamoorthy

AU - Eliseev, Evgeny A.

AU - Svechnikov, George S.

AU - Pennycook, Stephen J.

AU - Borisevich, Albina Y.

PY - 2011

Y1 - 2011

N2 - Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a-STEM image, b-corresponding displacement profile) is combined with Landau-Ginsburg-Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.

AB - Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a-STEM image, b-corresponding displacement profile) is combined with Landau-Ginsburg-Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.

KW - IR-104460

KW - METIS-280817

U2 - 10.1002/adma.201004641

DO - 10.1002/adma.201004641

M3 - Article

SN - 0935-9648

VL - 23

SP - 2474

EP - 2479

JO - Advanced materials

JF - Advanced materials

IS - 21

ER -

Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interface by Z-contrast imaging

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Keywords

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