Automated Double Cantilever Beam test system – A two-axis moving camera setup controlled by image analysis for crack recognition

J. van de Zand, Remko Akkerman

Research output: Contribution to conferencePaperAcademic

111 Downloads (Pure)
Original languageUndefined
Number of pages2
Publication statusPublished - 2010
EventSAMPE Benelux Student Seminar 2010 - Ermelo, The Netherlands
Duration: 12 Jan 201013 Jan 2010

Conference

ConferenceSAMPE Benelux Student Seminar 2010
Period12/01/1013/01/10
OtherJanuary 12-13, 2010

Keywords

  • IR-78163

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