Automated Double Cantilever Beam test system – A two-axis moving camera setup controlled by image analysis for crack recognition

Research output: Contribution to conference › Paper

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Original language	Undefined
Number of pages	2
Publication status	Published - 2010
Event	SAMPE Benelux Student Seminar 2010 - Ermelo, The Netherlands Duration: 12 Jan 2010 → 13 Jan 2010

Conference	SAMPE Benelux Student Seminar 2010
Period	12/01/10 → 13/01/10
Other	January 12-13, 2010

Keywords

@conference{d99cbc25a0ad45adbe26f477ecd75ac4,

title = "Automated Double Cantilever Beam test system – A two-axis moving camera setup controlled by image analysis for crack recognition",

keywords = "IR-78163",

author = "{van de Zand}, J. and Remko Akkerman",

year = "2010",

language = "Undefined",

note = "SAMPE Benelux Student Seminar 2010 ; Conference date: 12-01-2010 Through 13-01-2010",

}