Automatic functional mixed-signal test-pattern generation

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the IEEE International Conference on Circuits and Systems
Place of Publication	Rhodos, Greece
Pages	1072-1075
Publication status	Published - 14 Oct 1996

Keywords

@inproceedings{d3cbb401ba88475b99afcf21aadcdcf4,

title = "Automatic functional mixed-signal test-pattern generation",

keywords = "METIS-112976",

author = "Kerkhoff, \{Hans G.\} and R.J.W.T. Tangelder and H. Speek",

year = "1996",

month = oct,

day = "14",

language = "Undefined",

pages = "1072--1075",

booktitle = "Proceedings of the IEEE International Conference on Circuits and Systems",

}