Automatic landmark detection and face recognition for side-view face images

P. Santemiz; Lieuwe Jan Spreeuwers; Raymond N.J. Veldhuis

Automatic landmark detection and face recognition for side-view face images

P. Santemiz
, Lieuwe Jan Spreeuwers
, Raymond N.J. Veldhuis

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

533 Downloads (Pure)

Abstract

In real-life scenarios where pose variation is up to side-view positions, face recognition becomes a challenging task. In this paper we propose an automatic side-view face recognition system designed for home-safety applications. Our goal is to recognize people as they pass through doors in order to determine their location in the house. Here, we introduce a recognition method, where we detect facial landmarks automatically for registration and identify faces. We test our system on sideview face images from CMU-Multi PIE database. We achieve 95.95% accuracy on detecting landmarks, and 89.04% accuracy on identification.

Original language	Undefined
Title of host publication	2013 International Conference of the BIOSIG Special Interest Group (BIOSIG)
Editors	Arslan Broemme, Christoph Busch
Publisher	IEEE
Pages	337-344
Number of pages	8
ISBN (Print)	978-3-88579-606-0
Publication status	Published - 5 Sept 2013
Event	12th International Conference of the Biometrics Special Interest Group, BIOSIG 2013 - Darmstadt, Germany Duration: 4 Sept 2013 → 6 Sept 2013 Conference number: 12

Publication series

Name	Lecture Notes in Informatics (LNI) - Proceedings
Publisher	Gesellschaft für Informatik
Volume	P-212
ISSN (Print)	1617-5468

Conference

Conference	12th International Conference of the Biometrics Special Interest Group, BIOSIG 2013
Abbreviated title	BIOSIG 2013
Country/Territory	Germany
City	Darmstadt
Period	4/09/13 → 6/09/13

Keywords

SCS-Safety

Access to Document

Santemiz13automaticAccepted author version, 1.57 MB

https://ieeexplore.ieee.org/document/6617173

Cite this

Santemiz, P., Spreeuwers, L. J., & Veldhuis, R. N. J. (2013). Automatic landmark detection and face recognition for side-view face images. In A. Broemme, & C. Busch (Eds.), 2013 International Conference of the BIOSIG Special Interest Group (BIOSIG) (pp. 337-344). (Lecture Notes in Informatics (LNI) - Proceedings; Vol. P-212). IEEE. https://ieeexplore.ieee.org/document/6617173

@inproceedings{5e4b3a3433e344e89fcec956fba1a4a5,

title = "Automatic landmark detection and face recognition for side-view face images",

abstract = "In real-life scenarios where pose variation is up to side-view positions, face recognition becomes a challenging task. In this paper we propose an automatic side-view face recognition system designed for home-safety applications. Our goal is to recognize people as they pass through doors in order to determine their location in the house. Here, we introduce a recognition method, where we detect facial landmarks automatically for registration and identify faces. We test our system on sideview face images from CMU-Multi PIE database. We achieve 95.95\% accuracy on detecting landmarks, and 89.04\% accuracy on identification.",

keywords = "SCS-Safety",

author = "P. Santemiz and Spreeuwers, \{Lieuwe Jan\} and Veldhuis, \{Raymond N.J.\}",

year = "2013",

month = sep,

day = "5",

language = "Undefined",

isbn = "978-3-88579-606-0",

series = "Lecture Notes in Informatics (LNI) - Proceedings",

publisher = "IEEE",

pages = "337--344",

editor = "Arslan Broemme and Christoph Busch",

booktitle = "2013 International Conference of the BIOSIG Special Interest Group (BIOSIG)",

address = "United States",

note = "12th International Conference of the Biometrics Special Interest Group, BIOSIG 2013 ; Conference date: 04-09-2013 Through 06-09-2013",

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Santemiz, P, Spreeuwers, LJ & Veldhuis, RNJ 2013, Automatic landmark detection and face recognition for side-view face images. in A Broemme & C Busch (eds), 2013 International Conference of the BIOSIG Special Interest Group (BIOSIG). Lecture Notes in Informatics (LNI) - Proceedings, vol. P-212, IEEE, pp. 337-344, 12th International Conference of the Biometrics Special Interest Group, BIOSIG 2013, Darmstadt, Germany, 4/09/13. <https://ieeexplore.ieee.org/document/6617173>

Automatic landmark detection and face recognition for side-view face images. / Santemiz, P.; Spreeuwers, Lieuwe Jan; Veldhuis, Raymond N.J.
2013 International Conference of the BIOSIG Special Interest Group (BIOSIG). ed. / Arslan Broemme; Christoph Busch. IEEE, 2013. p. 337-344 (Lecture Notes in Informatics (LNI) - Proceedings; Vol. P-212).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - Automatic landmark detection and face recognition for side-view face images

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N2 - In real-life scenarios where pose variation is up to side-view positions, face recognition becomes a challenging task. In this paper we propose an automatic side-view face recognition system designed for home-safety applications. Our goal is to recognize people as they pass through doors in order to determine their location in the house. Here, we introduce a recognition method, where we detect facial landmarks automatically for registration and identify faces. We test our system on sideview face images from CMU-Multi PIE database. We achieve 95.95% accuracy on detecting landmarks, and 89.04% accuracy on identification.

AB - In real-life scenarios where pose variation is up to side-view positions, face recognition becomes a challenging task. In this paper we propose an automatic side-view face recognition system designed for home-safety applications. Our goal is to recognize people as they pass through doors in order to determine their location in the house. Here, we introduce a recognition method, where we detect facial landmarks automatically for registration and identify faces. We test our system on sideview face images from CMU-Multi PIE database. We achieve 95.95% accuracy on detecting landmarks, and 89.04% accuracy on identification.

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SN - 978-3-88579-606-0

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