Automatic Scan Insertion and Test Generation for Asynchronous Circuits

F.J. te Beest, A. Peeters, Marc Verra, K. van Berkel, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    19 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings International Test Conference
    Place of PublicationBaltimore (MD) USA
    Pages804-813
    Number of pages10
    Publication statusPublished - 8 Oct 2002

    Keywords

    • METIS-207540

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