Automatic Scan Insertion and Test Generation for Asynchronous Circuits

F.J. te Beest, A. Peeters, Marc Verra, K. van Berkel, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings International Test Conference
Place of Publication	Baltimore (MD) USA
Pages	804-813
Number of pages	10
Publication status	Published - 8 Oct 2002

Keywords

@inproceedings{acad711a31e649969e717991e46c22a4,

title = "Automatic Scan Insertion and Test Generation for Asynchronous Circuits",

keywords = "METIS-207540",

author = "\{te Beest\}, F.J. and A. Peeters and Marc Verra and \{van Berkel\}, K. and Kerkhoff, \{Hans G.\}",

year = "2002",

month = oct,

day = "8",

language = "Undefined",

isbn = "0-7803-7543-2",

pages = "804--813",

booktitle = "Proceedings International Test Conference",

}

TY - GEN

T1 - Automatic Scan Insertion and Test Generation for Asynchronous Circuits

AU - te Beest, F.J.

AU - Peeters, A.

AU - Verra, Marc

AU - van Berkel, K.

AU - Kerkhoff, Hans G.

PY - 2002/10/8

Y1 - 2002/10/8

KW - METIS-207540

M3 - Conference contribution

SN - 0-7803-7543-2

SP - 804

EP - 813

BT - Proceedings International Test Conference

CY - Baltimore (MD) USA

ER -