Automatic Structural Test Generation for Asynchronous Circuits

F.J. te Beest, A. Peeters, K. van Berkel, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings ProRISC
    Place of PublicationVeldhoven, the Netherlands
    Pages288-294
    Number of pages7
    Publication statusPublished - 29 Nov 2001
    Event14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003 - Veldhoven, Netherlands
    Duration: 25 Nov 200327 Nov 2003
    Conference number: 14

    Workshop

    Workshop14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003
    Abbreviated titleProRISC
    CountryNetherlands
    CityVeldhoven
    Period25/11/0327/11/03

    Keywords

    • METIS-201882

    Cite this