Automatic test plan generation for mixed-signal circuits in an integrated design and test environment

N. Engin, Hans G. Kerkhoff, R.J.W.T. Tangelder, H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of 3rd International Mixed-Signal Testing Workshop
    Place of PublicationSeattle USA
    Pages126-131
    Number of pages6
    Publication statusPublished - 1 Jun 1997

    Keywords

    • METIS-112975

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