Automatic test plan generation for mixed-signal circuits in an integrated design and test environment

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of 3rd International Mixed-Signal Testing Workshop
Place of Publication	Seattle USA
Pages	126-131
Number of pages	6
Publication status	Published - 1 Jun 1997

Keywords

@inproceedings{f93439e3956148a599b41535b951a8a2,

title = "Automatic test plan generation for mixed-signal circuits in an integrated design and test environment",

keywords = "METIS-112975",

author = "N. Engin and Kerkhoff, \{Hans G.\} and R.J.W.T. Tangelder and H. Speek",

year = "1997",

month = jun,

day = "1",

language = "Undefined",

pages = "126--131",

booktitle = "Proceedings of 3rd International Mixed-Signal Testing Workshop",

}

Automatic test plan generation for mixed-signal circuits in an integrated design and test environment. / Engin, N.; Kerkhoff, Hans G.; Tangelder, R.J.W.T. et al.
Proceedings of 3rd International Mixed-Signal Testing Workshop. Seattle USA, 1997. p. 126-131.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Automatic test plan generation for mixed-signal circuits in an integrated design and test environment

AU - Engin, N.

AU - Kerkhoff, Hans G.

AU - Tangelder, R.J.W.T.

AU - Speek, H.

PY - 1997/6/1

Y1 - 1997/6/1

KW - METIS-112975

M3 - Conference contribution

SP - 126

EP - 131

BT - Proceedings of 3rd International Mixed-Signal Testing Workshop

CY - Seattle USA

ER -