Automatic test-specification for macro-level BIST based on the boundary-scan standard

R.P. van Riessen, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings 2nd European Test Conference
Place of Publication	Munich
Pages	447-453
Number of pages	0
Publication status	Published - 1 Apr 1991

Keywords

@inproceedings{bb70744f34074583b1abe07d024819b0,

title = "Automatic test-specification for macro-level BIST based on the boundary-scan standard",

keywords = "METIS-112970",

author = "{van Riessen}, R.P. and Kerkhoff, {Hans G.}",

year = "1991",

month = apr,

day = "1",

language = "Undefined",

pages = "447--453",

booktitle = "Proceedings 2nd European Test Conference",

}