Automatic test-specification for macro-level BIST based on the boundary-scan standard

R.P. van Riessen, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 2nd European Test Conference
    Place of PublicationMunich
    Pages447-453
    Number of pages0
    Publication statusPublished - 1 Apr 1991

    Keywords

    • METIS-112970

    Cite this

    van Riessen, R. P., & Kerkhoff, H. G. (1991). Automatic test-specification for macro-level BIST based on the boundary-scan standard. In Proceedings 2nd European Test Conference (pp. 447-453). Munich.