Automotive IC reliability: Elements of the battle towards zero defects

F.G. Kuper

    Research output: Contribution to journalArticleAcademicpeer-review

    16 Citations (Scopus)

    Abstract

    The battle towards zero defects consists of fast response to PPM signals, prevention of incidents and continuous improvement. In this paper elements of all three branches are treated. A PPM analysis tool called quality crawl charts is introduced that enables prediction of customer complaint levels based on an early set of warranty call rate data. The fact that the automotive industry is very cautious with process and product changes can be better understood better with a given practical example of a small change with (in the eyes of automotive) big consequences. Finally it is shown that continuous PPM reduction activities also have an effect on the number of EOS/ESD customer returns, and that this category of fails form a shared responsibility for both supplier and customer.
    Original languageUndefined
    Article number10.1016/j.microrel.2008.06.026
    Pages (from-to)1459-1463
    Number of pages5
    JournalMicroelectronics reliability
    Volume48
    Issue number2/8-9
    DOIs
    Publication statusPublished - 22 Aug 2008

    Keywords

    • SC-ICRY: Integrated Circuit Reliability and Yield
    • EWI-13380
    • METIS-254886
    • IR-62448

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