BASTION: Board and SoC test instrumentation for ageing and no failure found

Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)

    Abstract

    This is an overview paper that motivates and describes performed work done in the European Commission funded research project BASTION, which focuses on two critical problems of modern electronics: the No-Fault-Found (NFF) and CMOS ageing. New defect classes contributing to NFF have been identified, including timing related faults (TRF) at board level and intermittent resistive faults (IRF) at IC level. BASTION has addressed the mechanisms of ageing and developed several techniques to improve the longevity of electronic products. Embedded Instrumentation, monitors, and IEEE 1687 standard for reconfigurable scan networks (RSN) are seen as an important leverage that helped mitigating the impact of the above listed problems by facilitating a low-latency, scalable online system health monitoring and error localization infrastructure as well as integration of all heterogeneous technologies into a homogeneous demonstration platform. This paper helps the reader to get a general overview of the work performed and provides a collection of references to publications where the respective research results are described in detail.
    Original languageEnglish
    Title of host publicationDesign, Automation & Test in Europe Conference & Exhibition (DATE), 2017
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Pages115-120
    ISBN (Electronic)978-3-9815370-8-6, 978-3-9815370-9-3
    ISBN (Print)978-1-5090-5826-6
    DOIs
    Publication statusPublished - 15 May 2017
    EventDesign, Automation and Test in Europe: the European event for electronic system design & test - Lausanne, Switzerland
    Duration: 27 Mar 201731 Mar 2017
    https://www.date-conference.com/date17/

    Conference

    ConferenceDesign, Automation and Test in Europe
    Abbreviated titleDATE-2017
    CountrySwitzerland
    CityLausanne
    Period27/03/1731/03/17
    Internet address

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