BASTION: Board and SoC test instrumentation for ageing and no failure found

Artur Jutman, Christophe lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

This is an overview paper that motivates and describes performed work done in the European Commission funded research project BASTION, which focuses on two critical problems of modern electronics: the No-Fault-Found (NFF) and CMOS ageing. New defect classes contributing to NFF have been identified, including timing related faults (TRF) at board level and intermittent resistive faults (IRF) at IC level. BASTION has addressed the mechanisms of ageing and developed several techniques to improve the longevity of electronic products. Embedded Instrumentation, monitors, and IEEE 1687 standard for reconfigurable scan networks (RSN) are seen as an important leverage that helped mitigating the impact of the above listed problems by facilitating a low-latency, scalable online system health monitoring and error localization infrastructure as well as integration of all heterogeneous technologies into a homogeneous demonstration platform. This paper helps the reader to get a general overview of the work performed and provides a collection of references to publications where the respective research results are described in detail.
Original languageEnglish
Title of host publicationDesign, Automation & Test in Europe Conference & Exhibition (DATE), 2017
PublisherIEEE
Pages115-120
ISBN (Electronic)978-3-9815370-8-6
DOIs
Publication statusPublished - 15 May 2017
EventDesign, Automation and Test in Europe: the European event for electronic system design & test - Lausanne, Switzerland
Duration: 27 Mar 201731 Mar 2017
https://www.date-conference.com/date17/

Conference

ConferenceDesign, Automation and Test in Europe
Abbreviated titleDATE-2017
CountrySwitzerland
CityLausanne
Period27/03/1731/03/17
Internet address

Fingerprint

Aging of materials
Online systems
Electronic equipment
Demonstrations
Health
Defects
Monitoring
System-on-chip

Cite this

Jutman, A., lotz, C., Larsson, E., Reorda, M. S., Jenihhin, M., Raik, J., ... Engelke, P. (2017). BASTION: Board and SoC test instrumentation for ageing and no failure found. In Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 (pp. 115-120). IEEE. https://doi.org/10.23919/DATE.2017.7926968
Jutman, Artur ; lotz, Christophe ; Larsson, Erik ; Reorda, Matteo Sonza ; Jenihhin, Maksim ; Raik, Jaan ; Kerkhoff, Hans G. ; Krenz-Baath, Rene ; Engelke, Piet. / BASTION: Board and SoC test instrumentation for ageing and no failure found. Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. IEEE, 2017. pp. 115-120
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author = "Artur Jutman and Christophe lotz and Erik Larsson and Reorda, {Matteo Sonza} and Maksim Jenihhin and Jaan Raik and Kerkhoff, {Hans G.} and Rene Krenz-Baath and Piet Engelke",
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Jutman, A, lotz, C, Larsson, E, Reorda, MS, Jenihhin, M, Raik, J, Kerkhoff, HG, Krenz-Baath, R & Engelke, P 2017, BASTION: Board and SoC test instrumentation for ageing and no failure found. in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. IEEE, pp. 115-120, Design, Automation and Test in Europe, Lausanne, Switzerland, 27/03/17. https://doi.org/10.23919/DATE.2017.7926968

BASTION: Board and SoC test instrumentation for ageing and no failure found. / Jutman, Artur; lotz, Christophe; Larsson, Erik; Reorda, Matteo Sonza ; Jenihhin, Maksim; Raik, Jaan; Kerkhoff, Hans G.; Krenz-Baath, Rene; Engelke, Piet.

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. IEEE, 2017. p. 115-120.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Jutman A, lotz C, Larsson E, Reorda MS, Jenihhin M, Raik J et al. BASTION: Board and SoC test instrumentation for ageing and no failure found. In Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. IEEE. 2017. p. 115-120 https://doi.org/10.23919/DATE.2017.7926968