The experimental results show that these novel batch fabricated scanning Hall probe can be used in tapping mode AFM, and have the capability of measuring the absolute value of the magnetic field distribution. Further reduction of resolution can be achieved by improvement of the instrumentation, and is ultimately limited only by the dimensions of the Hall cross. Since with corner lithography sub-100 nm linewidths are possible, these new probes are promising candidates for routine quantitative analysis of magnetic stray fields, such as above permanent magnets and magnetic recording heads.
|Publisher||IEEE Magnetics Society|
|Conference||IEEE International Magnetics Conference, INTERMAG 2014|
|Abbreviated title||INTERMAG 2014|
|Period||4/05/14 → 8/05/14|