Batch fabricated scanning Hall probes for quantitative imaging of magnetic stray fields

Kodai Hatakeyama, Rolf Vermeer, Martin Herman Siekman, Edin Sarajlic, Niels Roelof Tas, Leon Abelmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

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Abstract

The experimental results show that these novel batch fabricated scanning Hall probe can be used in tapping mode AFM, and have the capability of measuring the absolute value of the magnetic field distribution. Further reduction of resolution can be achieved by improvement of the instrumentation, and is ultimately limited only by the dimensions of the Hall cross. Since with corner lithography sub-100 nm linewidths are possible, these new probes are promising candidates for routine quantitative analysis of magnetic stray fields, such as above permanent magnets and magnetic recording heads.
Original languageUndefined
Title of host publicationIEEE International Magnetics Conference, INTERMAG 2014
Place of PublicationUSA
PublisherIEEE Magnetics Society
Pages1741-1742
Number of pages2
ISBN (Print)not assigned
Publication statusPublished - May 2014

Publication series

Name
PublisherIEEE Magnetics Society

Keywords

  • EWI-24829
  • METIS-304124
  • IR-91353

Cite this

Hatakeyama, K., Vermeer, R., Siekman, M. H., Sarajlic, E., Tas, N. R., & Abelmann, L. (2014). Batch fabricated scanning Hall probes for quantitative imaging of magnetic stray fields. In IEEE International Magnetics Conference, INTERMAG 2014 (pp. 1741-1742). USA: IEEE Magnetics Society.